Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging

An inspection system and related methods are provided. The inspection system includes an inspection camera, a plurality of light sources collocated with the inspection camera, and a post processing system. The plurality of light sources output directional light that have different respective ranges...

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Bibliographische Detailangaben

Hauptverfasser:	Kommareddy, Vamshi Krishna Reddy, Medhi, Biswajit, Graham, Andrew Crispin
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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