LEARNING APPARATUS, INFERENCE APPARATUS, INFERENCE SYSTEM, LEARNING METHOD, INFERENCE METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM

An apparatus calculates a positive pair similarity between a first feature vector of an image and a second feature vector associated with the same label as a label of the image, calculates a negative pair similarity between the first feature vector and a third feature vector associated with a label...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAKAMURA, Koichiro, SORAKADO, Hideki
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS
Online-Zugang:	Volltext bestellen
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