INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE

An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in a specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kato, Yutaka, Kurita, Masashi
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Kato, Yutaka
Kurita, Masashi
description An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in a specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to adapt to adjustment data different from training data of the model. From a set of element models including the plurality of first element models and the second element model, a plurality of the element models including at least one of the second element models are selected. An integrated model is generated by integrating the plurality of the element models selected. The integrated model outputs any of classes into which input data is classified based on presence or absence of all of a plurality of the specific features related to the plurality of the element models selected.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024135692A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024135692A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024135692A13</originalsourceid><addsrcrecordid>eNrjZFjr6Rfi6h7kGOLqouDr7-Lqo-Du6ucK5Hv6-yn4uoZ4-LvoKHj6Orq7Knj6BQe4OoMlgiODQ1x9sUhgGOHiGubp7EqMyoAgf6A7gIY6-rlgKoeYw8PAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4kODjQyMTAyNTc0sjRwNjYlTBQAMtUkn</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE</title><source>esp@cenet</source><creator>Kato, Yutaka ; Kurita, Masashi</creator><creatorcontrib>Kato, Yutaka ; Kurita, Masashi</creatorcontrib><description>An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in a specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to adapt to adjustment data different from training data of the model. From a set of element models including the plurality of first element models and the second element model, a plurality of the element models including at least one of the second element models are selected. An integrated model is generated by integrating the plurality of the element models selected. The integrated model outputs any of classes into which input data is classified based on presence or absence of all of a plurality of the specific features related to the plurality of the element models selected.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240425&amp;DB=EPODOC&amp;CC=US&amp;NR=2024135692A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240425&amp;DB=EPODOC&amp;CC=US&amp;NR=2024135692A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kato, Yutaka</creatorcontrib><creatorcontrib>Kurita, Masashi</creatorcontrib><title>INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE</title><description>An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in a specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to adapt to adjustment data different from training data of the model. From a set of element models including the plurality of first element models and the second element model, a plurality of the element models including at least one of the second element models are selected. An integrated model is generated by integrating the plurality of the element models selected. The integrated model outputs any of classes into which input data is classified based on presence or absence of all of a plurality of the specific features related to the plurality of the element models selected.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFjr6Rfi6h7kGOLqouDr7-Lqo-Du6ucK5Hv6-yn4uoZ4-LvoKHj6Orq7Knj6BQe4OoMlgiODQ1x9sUhgGOHiGubp7EqMyoAgf6A7gIY6-rlgKoeYw8PAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4kODjQyMTAyNTc0sjRwNjYlTBQAMtUkn</recordid><startdate>20240425</startdate><enddate>20240425</enddate><creator>Kato, Yutaka</creator><creator>Kurita, Masashi</creator><scope>EVB</scope></search><sort><creationdate>20240425</creationdate><title>INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE</title><author>Kato, Yutaka ; Kurita, Masashi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024135692A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Kato, Yutaka</creatorcontrib><creatorcontrib>Kurita, Masashi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kato, Yutaka</au><au>Kurita, Masashi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE</title><date>2024-04-25</date><risdate>2024</risdate><abstract>An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in a specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to adapt to adjustment data different from training data of the model. From a set of element models including the plurality of first element models and the second element model, a plurality of the element models including at least one of the second element models are selected. An integrated model is generated by integrating the plurality of the element models selected. The integrated model outputs any of classes into which input data is classified based on presence or absence of all of a plurality of the specific features related to the plurality of the element models selected.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2024135692A1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
title INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T11%3A34%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Kato,%20Yutaka&rft.date=2024-04-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024135692A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true