MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESSOR SOCKETS

MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESSOR SOCKETS

A low level contact resistance (LLCR) testing apparatus comprises a test board, an interface board, and a patch board. The test board comprises a processor socket. The interface board connects to both the test board and the patch board. The patch board connects to a contact resistance tester. An LLC...

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Hauptverfasser: Prabhugoud, Mohanraj, Shia, David, Liu, Lejie, Miele, Ralph V, Rodriguez Estrada, Silver Alfonso, Tessema, Caleb Million, Pei, Min
Format: Patent
Sprache:eng
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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container_issue
container_start_page
container_title
container_volume
creator Prabhugoud, Mohanraj
Shia, David
Liu, Lejie
Miele, Ralph V
Rodriguez Estrada, Silver Alfonso
Tessema, Caleb Million
Pei, Min
description A low level contact resistance (LLCR) testing apparatus comprises a test board, an interface board, and a patch board. The test board comprises a processor socket. The interface board connects to both the test board and the patch board. The patch board connects to a contact resistance tester. An LLCR system comprising the LLCR testing apparatus and a contact resistance tester can be portable. The test board can accommodate thermal management solutions of varying sizes and types. Different test board designs can accommodate different socket-processor configurations and the different test boards can be easily accommodated by an LLCR testing apparatus due to its modular design.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESSOR SOCKETS
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