END-TO-END MEASUREMENT FOR SEMICONDUCTOR SPECIMENS

There is provided a system and method for examining a semiconductor specimen. The method includes obtaining a runtime image of the specimen, and providing the runtime image as an input to an end-to-end (E2E) learning model to process, thereby obtaining, as an output of the E2E learning model, runtim...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FRANK, Tal, DUBOVSKI, Bar, PELED, Tomer Haim, SKARIA, Bobin Mathew, TAL, Noam, LEVANT, Boris
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY PHYSICS SEMICONDUCTOR DEVICES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!