SINGLE CORNER MIXED VOLTAGE NOISE IMPACT ON FUNCTION ANALYSIS

SINGLE CORNER MIXED VOLTAGE NOISE IMPACT ON FUNCTION ANALYSIS

A method, system, and computer program product are disclosed for implementing enhanced noise impact on function (NIOF) analysis of an IC design having nets in multiple different variable voltage domains next to each other and modeling all multiple worst-case victim-aggressor voltage configurations i...

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Hauptverfasser: RAO, Rahul M, UPRETI, Sanjay, SITKO, Michael Henry, KURTZ, Steven Joseph, CHANDRASEKARAN, Ajith Kumar Madathil
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator RAO, Rahul M
UPRETI, Sanjay
SITKO, Michael Henry
KURTZ, Steven Joseph
CHANDRASEKARAN, Ajith Kumar Madathil
description A method, system, and computer program product are disclosed for implementing enhanced noise impact on function (NIOF) analysis of an IC design having nets in multiple different variable voltage domains next to each other and modeling all multiple worst-case victim-aggressor voltage configurations in a single run leveraging noise abstracts characterized at a single voltage corner. The NIOF analysis enables accurately identifying incorrect victim switching or functional fails, effectively and efficiently providing design verification and the ability to sign-off an IC design with a single run, and enable modifying an integrated circuit design to fix NIOF failures, and fabricating an integrated circuit.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title SINGLE CORNER MIXED VOLTAGE NOISE IMPACT ON FUNCTION ANALYSIS
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