IN SITU EVALUATION OF FILTER PARAMETERS WITH OPTICOANALYTICAL DEVICES

A system can include a filter assembly with a filter and a substance in the filter assembly, and at least one optical computing device having an integrated computational element which receives electromagnetic radiation from the substance. A method can include receiving electromagnetic radiation from...

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Hauptverfasser:	Freese, Robert P, Maguire-Boyle, Samuel J
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION TESTING TRANSPORTING
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creator	Freese, Robert P Maguire-Boyle, Samuel J
description	A system can include a filter assembly with a filter and a substance in the filter assembly, and at least one optical computing device having an integrated computational element which receives electromagnetic radiation from the substance. A method can include receiving electromagnetic radiation from a substance in a filter assembly, the electromagnetic radiation from the substance being received by at least one optical computing device having an integrated computational element, and the receiving being performed while a filter is positioned in the filter assembly. A detector may receive electromagnetic radiation from the integrated computational element and produce an output correlated to a characteristic of the substance. A mitigation technique may be selected, based on the detector output.
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subjects	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION TESTING TRANSPORTING
title	IN SITU EVALUATION OF FILTER PARAMETERS WITH OPTICOANALYTICAL DEVICES
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