INDUCTIVE POSITION-MEASURING DEVICE
An inductive position-measuring device includes a scanning element and a graduation element movable relative thereto along a direction. The scanning element has an excitation conductor, and first and second receiver tracks each having a receiver conductor, which extends along the direction according...
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| creator | Tiemann, Marc Oliver Heumann, Martin Heinemann, Christoph |
| description | An inductive position-measuring device includes a scanning element and a graduation element movable relative thereto along a direction. The scanning element has an excitation conductor, and first and second receiver tracks each having a receiver conductor, which extends along the direction according to first and second periodic patterns, respectively, over a length. A graduation track has graduation structures formed of ridges and gaps. The ridges have different widths, or the gaps have different depths or different widths, in the direction. The receiver conductors of the first and second receiver tracks are configured to generate first and second signals having first and second period lengths, respectively, wherein n times the first period length equals m times the second period length, with m and n being relatively prime, and n times the first period length and m times the second period length both being less than or equal to the length. |
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The scanning element has an excitation conductor, and first and second receiver tracks each having a receiver conductor, which extends along the direction according to first and second periodic patterns, respectively, over a length. A graduation track has graduation structures formed of ridges and gaps. The ridges have different widths, or the gaps have different depths or different widths, in the direction. The receiver conductors of the first and second receiver tracks are configured to generate first and second signals having first and second period lengths, respectively, wherein n times the first period length equals m times the second period length, with m and n being relatively prime, and n times the first period length and m times the second period length both being less than or equal to the length.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240328&DB=EPODOC&CC=US&NR=2024102787A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240328&DB=EPODOC&CC=US&NR=2024102787A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Tiemann, Marc Oliver</creatorcontrib><creatorcontrib>Heumann, Martin</creatorcontrib><creatorcontrib>Heinemann, Christoph</creatorcontrib><title>INDUCTIVE POSITION-MEASURING DEVICE</title><description>An inductive position-measuring device includes a scanning element and a graduation element movable relative thereto along a direction. 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The receiver conductors of the first and second receiver tracks are configured to generate first and second signals having first and second period lengths, respectively, wherein n times the first period length equals m times the second period length, with m and n being relatively prime, and n times the first period length and m times the second period length both being less than or equal to the length.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD29HMJdQ7xDHNVCPAP9gzx9PfT9XV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRiaGBkbmFuaOhsbEqQIAArEj6A</recordid><startdate>20240328</startdate><enddate>20240328</enddate><creator>Tiemann, Marc Oliver</creator><creator>Heumann, Martin</creator><creator>Heinemann, Christoph</creator><scope>EVB</scope></search><sort><creationdate>20240328</creationdate><title>INDUCTIVE POSITION-MEASURING DEVICE</title><author>Tiemann, Marc Oliver ; Heumann, Martin ; Heinemann, Christoph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024102787A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Tiemann, Marc Oliver</creatorcontrib><creatorcontrib>Heumann, Martin</creatorcontrib><creatorcontrib>Heinemann, Christoph</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tiemann, Marc Oliver</au><au>Heumann, Martin</au><au>Heinemann, Christoph</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INDUCTIVE POSITION-MEASURING DEVICE</title><date>2024-03-28</date><risdate>2024</risdate><abstract>An inductive position-measuring device includes a scanning element and a graduation element movable relative thereto along a direction. The scanning element has an excitation conductor, and first and second receiver tracks each having a receiver conductor, which extends along the direction according to first and second periodic patterns, respectively, over a length. A graduation track has graduation structures formed of ridges and gaps. The ridges have different widths, or the gaps have different depths or different widths, in the direction. The receiver conductors of the first and second receiver tracks are configured to generate first and second signals having first and second period lengths, respectively, wherein n times the first period length equals m times the second period length, with m and n being relatively prime, and n times the first period length and m times the second period length both being less than or equal to the length.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | INDUCTIVE POSITION-MEASURING DEVICE |
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