ETCHING CONTROL SYSTEM AND ETCHING CONTROL METHOD

An etching control system includes a prediction device and an etching control device. The prediction device includes a calculator configured to calculate, by using a model indicating a relationship between distribution of an etching amount within a surface of a substrate and a process parameter, whi...

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Bibliographische Detailangaben
Hauptverfasser: Tsuruda, Toyohisa, Lee, Suguen, Marumoto, Hiroshi, Enomoto, Masashi
Format: Patent
Sprache:eng
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