Method and System for Measuring Components and Program

Method and System for Measuring Components and Program

A method for measuring components produced by a production device includes selecting components to be measured from multiple components. The selection is made according to at least one selection parameter. The at least one selection parameter includes a sampling frequency. The method includes determ...

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Hauptverfasser: Dotschkal, Florian, Haas, Günter
Format: Patent
Sprache:eng
Schlagworte:
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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creator Dotschkal, Florian
Haas, Günter
description A method for measuring components produced by a production device includes selecting components to be measured from multiple components. The selection is made according to at least one selection parameter. The at least one selection parameter includes a sampling frequency. The method includes determining at least one production parameter. The at least one production parameter includes a production condition. The method includes adapting the sampling frequency based on the production parameter or a change in the production parameter. Adapting includes reducing the sampling frequency in response to one or more production parameters not changing by more than a predetermined amount.
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
title Method and System for Measuring Components and Program
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