Temperature Measurement Facility
A temperature measurement facility for determining a medium temperature of a medium from first and second temperatures at a location immediately around a surface surrounding the medium includes a first and second sensors for determining the first and second temperatures, and a measured value process...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | A temperature measurement facility for determining a medium temperature of a medium from first and second temperatures at a location immediately around a surface surrounding the medium includes a first and second sensors for determining the first and second temperatures, and a measured value processor connected to the first and second sensors by a first and second feed lines and which provides, cyclically over time, at a measurement interval the first and second temperatures as the measured value for determining the medium temperature, wherein an evaluator is configured to determine a rate of change, from a difference between the first and second temperatures, and depending on its value configured to provide a quality feature, and is further configured to transmit the quality feature, as an evaluation of a measurement accuracy of the medium temperature, together with the measured value of the medium temperature, to a higher-level system. |
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