Temperature Measurement Facility

A temperature measurement facility for determining a medium temperature of a medium from first and second temperatures at a location immediately around a surface surrounding the medium includes a first and second sensors for determining the first and second temperatures, and a measured value process...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: VON DOSKY, Stefan, SCHERER, Tim, BIERWEILER, Thomas
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A temperature measurement facility for determining a medium temperature of a medium from first and second temperatures at a location immediately around a surface surrounding the medium includes a first and second sensors for determining the first and second temperatures, and a measured value processor connected to the first and second sensors by a first and second feed lines and which provides, cyclically over time, at a measurement interval the first and second temperatures as the measured value for determining the medium temperature, wherein an evaluator is configured to determine a rate of change, from a difference between the first and second temperatures, and depending on its value configured to provide a quality feature, and is further configured to transmit the quality feature, as an evaluation of a measurement accuracy of the medium temperature, together with the measured value of the medium temperature, to a higher-level system.