OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING

An optoelectronic device comprises a light processing device that, in turn, comprises at least one light sensor, the light processing device further comprising a device through-opening. The optoelectronic device further comprises a light source supported by a light source carrier adjacent to but not...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DE COI, Beat, GRIGO, Uwe
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator DE COI, Beat
GRIGO, Uwe
description An optoelectronic device comprises a light processing device that, in turn, comprises at least one light sensor, the light processing device further comprising a device through-opening. The optoelectronic device further comprises a light source supported by a light source carrier adjacent to but not in direct contact with the light processing device, the light source configured to align with the device through-opening in the light processing device such that light emitted by the light source emerges from the device through-opening. The light processing device may comprise one or more first connection elements and the light source carrier may comprise one or more second connection elements corresponding to the first connection elements, the light processing device being operatively connected to the light source carrier via the first connection elements and the corresponding second connection elements.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024044675A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024044675A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024044675A13</originalsourceid><addsrcrecordid>eNrjZPD3Dwjxd_VxdQ4J8vfzdFZwcQ3zdHZVcPb3DQjyDPb0c1fw8XT3CFEICPJ3dg0GC0CVhHuGeCg4KoR4BPmHunvo-ge4-gFleRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGRiYGJiZm5qaOhMXGqAC3OMAM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING</title><source>esp@cenet</source><creator>DE COI, Beat ; GRIGO, Uwe</creator><creatorcontrib>DE COI, Beat ; GRIGO, Uwe</creatorcontrib><description>An optoelectronic device comprises a light processing device that, in turn, comprises at least one light sensor, the light processing device further comprising a device through-opening. The optoelectronic device further comprises a light source supported by a light source carrier adjacent to but not in direct contact with the light processing device, the light source configured to align with the device through-opening in the light processing device such that light emitted by the light source emerges from the device through-opening. The light processing device may comprise one or more first connection elements and the light source carrier may comprise one or more second connection elements corresponding to the first connection elements, the light processing device being operatively connected to the light source carrier via the first connection elements and the corresponding second connection elements.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240208&amp;DB=EPODOC&amp;CC=US&amp;NR=2024044675A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240208&amp;DB=EPODOC&amp;CC=US&amp;NR=2024044675A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DE COI, Beat</creatorcontrib><creatorcontrib>GRIGO, Uwe</creatorcontrib><title>OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING</title><description>An optoelectronic device comprises a light processing device that, in turn, comprises at least one light sensor, the light processing device further comprising a device through-opening. The optoelectronic device further comprises a light source supported by a light source carrier adjacent to but not in direct contact with the light processing device, the light source configured to align with the device through-opening in the light processing device such that light emitted by the light source emerges from the device through-opening. The light processing device may comprise one or more first connection elements and the light source carrier may comprise one or more second connection elements corresponding to the first connection elements, the light processing device being operatively connected to the light source carrier via the first connection elements and the corresponding second connection elements.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPD3Dwjxd_VxdQ4J8vfzdFZwcQ3zdHZVcPb3DQjyDPb0c1fw8XT3CFEICPJ3dg0GC0CVhHuGeCg4KoR4BPmHunvo-ge4-gFleRhY0xJzilN5oTQ3g7Kba4izh25qQX58anFBYnJqXmpJfGiwkYGRiYGJiZm5qaOhMXGqAC3OMAM</recordid><startdate>20240208</startdate><enddate>20240208</enddate><creator>DE COI, Beat</creator><creator>GRIGO, Uwe</creator><scope>EVB</scope></search><sort><creationdate>20240208</creationdate><title>OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING</title><author>DE COI, Beat ; GRIGO, Uwe</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024044675A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>DE COI, Beat</creatorcontrib><creatorcontrib>GRIGO, Uwe</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DE COI, Beat</au><au>GRIGO, Uwe</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING</title><date>2024-02-08</date><risdate>2024</risdate><abstract>An optoelectronic device comprises a light processing device that, in turn, comprises at least one light sensor, the light processing device further comprising a device through-opening. The optoelectronic device further comprises a light source supported by a light source carrier adjacent to but not in direct contact with the light processing device, the light source configured to align with the device through-opening in the light processing device such that light emitted by the light source emerges from the device through-opening. The light processing device may comprise one or more first connection elements and the light source carrier may comprise one or more second connection elements corresponding to the first connection elements, the light processing device being operatively connected to the light source carrier via the first connection elements and the corresponding second connection elements.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2024044675A1
source esp@cenet
subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title OPTOELECTRONIC DEVICE COMPRISING LIGHT PROCESSING DEVICE WITH A THROUGH-OPENING
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T13%3A37%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=DE%20COI,%20Beat&rft.date=2024-02-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024044675A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true