CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM

According to one embodiment, a cassette housing includes a storage unit, a probe card, and a container. The storage unit stores a semiconductor wafer including a plurality of nonvolatile memory chips. The probe card includes a probe. The probe is configured to be brought into contact with a pad elec...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HAYASAKA, Kazuhito, INOUE, Arata, HITOMI, Tatsuro, DOHMAE, Hiroyuki, SANUKI, Tomoya, YOSHIMIZU, Yasuhito
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HAYASAKA, Kazuhito
INOUE, Arata
HITOMI, Tatsuro
DOHMAE, Hiroyuki
SANUKI, Tomoya
YOSHIMIZU, Yasuhito
description According to one embodiment, a cassette housing includes a storage unit, a probe card, and a container. The storage unit stores a semiconductor wafer including a plurality of nonvolatile memory chips. The probe card includes a probe. The probe is configured to be brought into contact with a pad electrode provided on the semiconductor wafer. The container contains heat transfer fluid for lowering or raising temperature of one or both of the probe card and the semiconductor wafer stored in the storage unit.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024014061A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024014061A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024014061A13</originalsourceid><addsrcrecordid>eNrjZLB0dgwOdg0JcVXw8A8N9vRz11EICPJ3cg3SUQh2DQpzDVIIcnT21lFw9HNRCA7xD3J0d1UIjgwOcfXlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkYmBoYmBmaGjobGxKkCABgiKWg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM</title><source>esp@cenet</source><creator>HAYASAKA, Kazuhito ; INOUE, Arata ; HITOMI, Tatsuro ; DOHMAE, Hiroyuki ; SANUKI, Tomoya ; YOSHIMIZU, Yasuhito</creator><creatorcontrib>HAYASAKA, Kazuhito ; INOUE, Arata ; HITOMI, Tatsuro ; DOHMAE, Hiroyuki ; SANUKI, Tomoya ; YOSHIMIZU, Yasuhito</creatorcontrib><description>According to one embodiment, a cassette housing includes a storage unit, a probe card, and a container. The storage unit stores a semiconductor wafer including a plurality of nonvolatile memory chips. The probe card includes a probe. The probe is configured to be brought into contact with a pad electrode provided on the semiconductor wafer. The container contains heat transfer fluid for lowering or raising temperature of one or both of the probe card and the semiconductor wafer stored in the storage unit.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240111&amp;DB=EPODOC&amp;CC=US&amp;NR=2024014061A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240111&amp;DB=EPODOC&amp;CC=US&amp;NR=2024014061A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAYASAKA, Kazuhito</creatorcontrib><creatorcontrib>INOUE, Arata</creatorcontrib><creatorcontrib>HITOMI, Tatsuro</creatorcontrib><creatorcontrib>DOHMAE, Hiroyuki</creatorcontrib><creatorcontrib>SANUKI, Tomoya</creatorcontrib><creatorcontrib>YOSHIMIZU, Yasuhito</creatorcontrib><title>CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM</title><description>According to one embodiment, a cassette housing includes a storage unit, a probe card, and a container. The storage unit stores a semiconductor wafer including a plurality of nonvolatile memory chips. The probe card includes a probe. The probe is configured to be brought into contact with a pad electrode provided on the semiconductor wafer. The container contains heat transfer fluid for lowering or raising temperature of one or both of the probe card and the semiconductor wafer stored in the storage unit.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB0dgwOdg0JcVXw8A8N9vRz11EICPJ3cg3SUQh2DQpzDVIIcnT21lFw9HNRCA7xD3J0d1UIjgwOcfXlYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkYmBoYmBmaGjobGxKkCABgiKWg</recordid><startdate>20240111</startdate><enddate>20240111</enddate><creator>HAYASAKA, Kazuhito</creator><creator>INOUE, Arata</creator><creator>HITOMI, Tatsuro</creator><creator>DOHMAE, Hiroyuki</creator><creator>SANUKI, Tomoya</creator><creator>YOSHIMIZU, Yasuhito</creator><scope>EVB</scope></search><sort><creationdate>20240111</creationdate><title>CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM</title><author>HAYASAKA, Kazuhito ; INOUE, Arata ; HITOMI, Tatsuro ; DOHMAE, Hiroyuki ; SANUKI, Tomoya ; YOSHIMIZU, Yasuhito</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024014061A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HAYASAKA, Kazuhito</creatorcontrib><creatorcontrib>INOUE, Arata</creatorcontrib><creatorcontrib>HITOMI, Tatsuro</creatorcontrib><creatorcontrib>DOHMAE, Hiroyuki</creatorcontrib><creatorcontrib>SANUKI, Tomoya</creatorcontrib><creatorcontrib>YOSHIMIZU, Yasuhito</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAYASAKA, Kazuhito</au><au>INOUE, Arata</au><au>HITOMI, Tatsuro</au><au>DOHMAE, Hiroyuki</au><au>SANUKI, Tomoya</au><au>YOSHIMIZU, Yasuhito</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM</title><date>2024-01-11</date><risdate>2024</risdate><abstract>According to one embodiment, a cassette housing includes a storage unit, a probe card, and a container. The storage unit stores a semiconductor wafer including a plurality of nonvolatile memory chips. The probe card includes a probe. The probe is configured to be brought into contact with a pad electrode provided on the semiconductor wafer. The container contains heat transfer fluid for lowering or raising temperature of one or both of the probe card and the semiconductor wafer stored in the storage unit.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2024014061A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T01%3A29%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HAYASAKA,%20Kazuhito&rft.date=2024-01-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024014061A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true