METHOD AND APPARATUS FOR PROCESSING A SAMPLE
The invention proposes a method for processing a sample with a processing arrangement, comprising the steps of:taking up a particle adhering on a sample surface of the sample with a measuring tip of the processing arrangement;modifying a physical and/or chemical nature of a surface section on the sa...
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| creator | Schoeneberg, Johannes Schnoor, Dominik Weber, Julia Kornilov, Kinga Baur, Christof Rumler, Maximilian |
| description | The invention proposes a method for processing a sample with a processing arrangement, comprising the steps of:taking up a particle adhering on a sample surface of the sample with a measuring tip of the processing arrangement;modifying a physical and/or chemical nature of a surface section on the sample or on a deposition unit for providing an activated surface section; andmoving the measuring tip into an interaction region of the activated surface section in which an attractive interaction acts between the particle taken up by the measuring tip and the activated surface section in order to transfer the particle from the measuring tip to the activated surface section. |
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andmoving the measuring tip into an interaction region of the activated surface section in which an attractive interaction acts between the particle taken up by the measuring tip and the activated surface section in order to transfer the particle from the measuring tip to the activated surface section.</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; MEASURING ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231228&DB=EPODOC&CC=US&NR=2023418153A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231228&DB=EPODOC&CC=US&NR=2023418153A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Schoeneberg, Johannes</creatorcontrib><creatorcontrib>Schnoor, Dominik</creatorcontrib><creatorcontrib>Weber, Julia</creatorcontrib><creatorcontrib>Kornilov, Kinga</creatorcontrib><creatorcontrib>Baur, Christof</creatorcontrib><creatorcontrib>Rumler, Maximilian</creatorcontrib><title>METHOD AND APPARATUS FOR PROCESSING A SAMPLE</title><description>The invention proposes a method for processing a sample with a processing arrangement, comprising the steps of:taking up a particle adhering on a sample surface of the sample with a measuring tip of the processing arrangement;modifying a physical and/or chemical nature of a surface section on the sample or on a deposition unit for providing an activated surface section; 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andmoving the measuring tip into an interaction region of the activated surface section in which an attractive interaction acts between the particle taken up by the measuring tip and the activated surface section in order to transfer the particle from the measuring tip to the activated surface section.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | APPARATUS SPECIALLY ADAPTED THEREFOR APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR MEASURING ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
| title | METHOD AND APPARATUS FOR PROCESSING A SAMPLE |
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