IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM
An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | INOUE, Satoru URATANI, Shoichi |
| description | An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained by extracting a low-order image feature amount and a high-order image feature amount from a reference image associated with an impression evaluation, with data of the image feature amounts extracted by a feature amount extractor, and calculates a similarity between the evaluation target image and the reference image. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023386079A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023386079A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023386079A13</originalsourceid><addsrcrecordid>eNrjZPDx9A0Icg0O9vT3U3D0c_SJDPYMVgiODA5x9dVRwCbn6xri4e-iAxRwUQhydfYPcvH0cweKuniG-vIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDI2NjCzMDc0tHQ2PiVAEAqMsvQA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM</title><source>esp@cenet</source><creator>INOUE, Satoru ; URATANI, Shoichi</creator><creatorcontrib>INOUE, Satoru ; URATANI, Shoichi</creatorcontrib><description>An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained by extracting a low-order image feature amount and a high-order image feature amount from a reference image associated with an impression evaluation, with data of the image feature amounts extracted by a feature amount extractor, and calculates a similarity between the evaluation target image and the reference image.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231130&DB=EPODOC&CC=US&NR=2023386079A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231130&DB=EPODOC&CC=US&NR=2023386079A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>INOUE, Satoru</creatorcontrib><creatorcontrib>URATANI, Shoichi</creatorcontrib><title>IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM</title><description>An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained by extracting a low-order image feature amount and a high-order image feature amount from a reference image associated with an impression evaluation, with data of the image feature amounts extracted by a feature amount extractor, and calculates a similarity between the evaluation target image and the reference image.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPDx9A0Icg0O9vT3U3D0c_SJDPYMVgiODA5x9dVRwCbn6xri4e-iAxRwUQhydfYPcvH0cweKuniG-vIwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDI2NjCzMDc0tHQ2PiVAEAqMsvQA</recordid><startdate>20231130</startdate><enddate>20231130</enddate><creator>INOUE, Satoru</creator><creator>URATANI, Shoichi</creator><scope>EVB</scope></search><sort><creationdate>20231130</creationdate><title>IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM</title><author>INOUE, Satoru ; URATANI, Shoichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023386079A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>INOUE, Satoru</creatorcontrib><creatorcontrib>URATANI, Shoichi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>INOUE, Satoru</au><au>URATANI, Shoichi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM</title><date>2023-11-30</date><risdate>2023</risdate><abstract>An impression analysis system includes: an input obtainer that receives an evaluation target image; and a hardware processor, wherein the hardware processor: extracts a low-order image feature amount, and a high-order image feature amount, from the evaluation target image, and compares data obtained by extracting a low-order image feature amount and a high-order image feature amount from a reference image associated with an impression evaluation, with data of the image feature amounts extracted by a feature amount extractor, and calculates a similarity between the evaluation target image and the reference image.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2023386079A1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
| title | IMPRESSION ANALYSIS SYSTEM, IMPRESSION ANALYSIS METHOD, AND RECORDING MEDIUM |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-05T17%3A07%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=INOUE,%20Satoru&rft.date=2023-11-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023386079A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |