METHODS AND APPARATUS FOR DETERMINING DIELECTRIC CONSTANT AND RESISTIVITY WITH ELECTROMAGNETIC PROPAGATION MEASUREMENTS

METHODS AND APPARATUS FOR DETERMINING DIELECTRIC CONSTANT AND RESISTIVITY WITH ELECTROMAGNETIC PROPAGATION MEASUREMENTS

A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Wang, Gong Li, Zhang, Ping, Ma, Shouxiang, Homan, Dean M, Abdallah, Wael
Format: Patent
Sprache:eng
Schlagworte:
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method for estimating resistivity and dielectric constant values of a multi-layer subterranean formation acquiring electromagnetic propagation measurements of the subterranean formation and processing the measurements via inversion to compute the resistivity and dielectric constant values. A one-dimensional formation model is utilized including a plurality of formation layers in which each of the formation layers includes a resistivity value and a dielectric constant value.