IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SPECIMEN IMAGING
Disclosed herein are systems for imaging of samples, for example, using an array of micro optical elements and methods of their use. In some embodiments, an optical chip comprising an array of micro optical elements moves relative to an imaging window and a detector in order to scan over a sample to...
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| creator | Horisberger, Aurèle Timothée Joss, Diego Schmitt, Frédéric Rachet, Bastien Naumenko, Andrey Shaffer, Etienne Pirolet, Jonathan Abel |
| description | Disclosed herein are systems for imaging of samples, for example, using an array of micro optical elements and methods of their use. In some embodiments, an optical chip comprising an array of micro optical elements moves relative to an imaging window and a detector in order to scan over a sample to produce an image. A focal plane can reside within a sample or on its surface during imaging. In some embodiments, detecting optics a reused to detect back-emitted light collected by an array of micro optical elements that is generated by an illumination beam impinging on a sample. In some embodiments, an imaging system has a large field of view and a large optical chip such that an entire surface of a sample can be imaged quickly. In some embodiments, a sample is accessible by a user during imaging due to the sample being exposed. |
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In some embodiments, an optical chip comprising an array of micro optical elements moves relative to an imaging window and a detector in order to scan over a sample to produce an image. A focal plane can reside within a sample or on its surface during imaging. In some embodiments, detecting optics a reused to detect back-emitted light collected by an array of micro optical elements that is generated by an illumination beam impinging on a sample. In some embodiments, an imaging system has a large field of view and a large optical chip such that an entire surface of a sample can be imaged quickly. In some embodiments, a sample is accessible by a user during imaging due to the sample being exposed.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231109&DB=EPODOC&CC=US&NR=2023359007A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231109&DB=EPODOC&CC=US&NR=2023359007A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Horisberger, Aurèle Timothée</creatorcontrib><creatorcontrib>Joss, Diego</creatorcontrib><creatorcontrib>Schmitt, Frédéric</creatorcontrib><creatorcontrib>Rachet, Bastien</creatorcontrib><creatorcontrib>Naumenko, Andrey</creatorcontrib><creatorcontrib>Shaffer, Etienne</creatorcontrib><creatorcontrib>Pirolet, Jonathan Abel</creatorcontrib><title>IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SPECIMEN IMAGING</title><description>Disclosed herein are systems for imaging of samples, for example, using an array of micro optical elements and methods of their use. 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In some embodiments, a sample is accessible by a user during imaging due to the sample being exposed.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAj09HV09_RzVwiODA5x9Q1WCPcM8VDw9XQO8lfwDwjxdHb0UXD1cfV19QtRcAwKcowMVnD0c1HwdQ3x8HcJVvB3UwgOcHX2BMorQE3iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkbGxqaWBgbmjobGxKkCAFrOMCg</recordid><startdate>20231109</startdate><enddate>20231109</enddate><creator>Horisberger, Aurèle Timothée</creator><creator>Joss, Diego</creator><creator>Schmitt, Frédéric</creator><creator>Rachet, Bastien</creator><creator>Naumenko, Andrey</creator><creator>Shaffer, Etienne</creator><creator>Pirolet, Jonathan Abel</creator><scope>EVB</scope></search><sort><creationdate>20231109</creationdate><title>IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SPECIMEN IMAGING</title><author>Horisberger, Aurèle Timothée ; Joss, Diego ; Schmitt, Frédéric ; Rachet, Bastien ; Naumenko, Andrey ; Shaffer, Etienne ; Pirolet, Jonathan Abel</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023359007A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Horisberger, Aurèle Timothée</creatorcontrib><creatorcontrib>Joss, Diego</creatorcontrib><creatorcontrib>Schmitt, Frédéric</creatorcontrib><creatorcontrib>Rachet, Bastien</creatorcontrib><creatorcontrib>Naumenko, Andrey</creatorcontrib><creatorcontrib>Shaffer, Etienne</creatorcontrib><creatorcontrib>Pirolet, Jonathan Abel</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Horisberger, Aurèle Timothée</au><au>Joss, Diego</au><au>Schmitt, Frédéric</au><au>Rachet, Bastien</au><au>Naumenko, Andrey</au><au>Shaffer, Etienne</au><au>Pirolet, Jonathan Abel</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SPECIMEN IMAGING</title><date>2023-11-09</date><risdate>2023</risdate><abstract>Disclosed herein are systems for imaging of samples, for example, using an array of micro optical elements and methods of their use. In some embodiments, an optical chip comprising an array of micro optical elements moves relative to an imaging window and a detector in order to scan over a sample to produce an image. A focal plane can reside within a sample or on its surface during imaging. In some embodiments, detecting optics a reused to detect back-emitted light collected by an array of micro optical elements that is generated by an illumination beam impinging on a sample. In some embodiments, an imaging system has a large field of view and a large optical chip such that an entire surface of a sample can be imaged quickly. In some embodiments, a sample is accessible by a user during imaging due to the sample being exposed.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
| title | IMAGING SYSTEMS WITH MICRO OPTICAL ELEMENT ARRAYS AND METHODS OF SPECIMEN IMAGING |
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