PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket oper...

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Hauptverfasser:	Leventhal, Ira, Oseguera, Gilberto, Kabbani, Samer, Kiyokawa, Toshiyuki, CRUZAN, Gregory, RANGANATHAN, Karthik, Ikeda, Hiroki
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	Leventhal, Ira Oseguera, Gilberto Kabbani, Samer Kiyokawa, Toshiyuki CRUZAN, Gregory RANGANATHAN, Karthik Ikeda, Hiroki
description	A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack, and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board. The testing apparatus further comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.
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The testing apparatus further comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.</abstract><oa>free_for_read</oa></addata></record>
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subjects	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM
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