Test Abstraction Data Model

Test Abstraction Data Model

Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring...

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Hauptverfasser: Soni, Ritesh K, Moeller, Jan Viborg, Dove, Andrew Philip, Peck, Joseph E
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator Soni, Ritesh K
Moeller, Jan Viborg
Dove, Andrew Philip
Peck, Joseph E
description Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023266390A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023266390A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023266390A13</originalsourceid><addsrcrecordid>eNrjZJAOSS0uUXBMKi4pSkwuyczPU3BJLElU8M1PSc3hYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkbGRmZmxpYGjobGxKkCANN6I90</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test Abstraction Data Model</title><source>esp@cenet</source><creator>Soni, Ritesh K ; Moeller, Jan Viborg ; Dove, Andrew Philip ; Peck, Joseph E</creator><creatorcontrib>Soni, Ritesh K ; Moeller, Jan Viborg ; Dove, Andrew Philip ; Peck, Joseph E</creatorcontrib><description>Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230824&amp;DB=EPODOC&amp;CC=US&amp;NR=2023266390A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230824&amp;DB=EPODOC&amp;CC=US&amp;NR=2023266390A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Soni, Ritesh K</creatorcontrib><creatorcontrib>Moeller, Jan Viborg</creatorcontrib><creatorcontrib>Dove, Andrew Philip</creatorcontrib><creatorcontrib>Peck, Joseph E</creatorcontrib><title>Test Abstraction Data Model</title><description>Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAOSS0uUXBMKi4pSkwuyczPU3BJLElU8M1PSc3hYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkbGRmZmxpYGjobGxKkCANN6I90</recordid><startdate>20230824</startdate><enddate>20230824</enddate><creator>Soni, Ritesh K</creator><creator>Moeller, Jan Viborg</creator><creator>Dove, Andrew Philip</creator><creator>Peck, Joseph E</creator><scope>EVB</scope></search><sort><creationdate>20230824</creationdate><title>Test Abstraction Data Model</title><author>Soni, Ritesh K ; Moeller, Jan Viborg ; Dove, Andrew Philip ; Peck, Joseph E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023266390A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Soni, Ritesh K</creatorcontrib><creatorcontrib>Moeller, Jan Viborg</creatorcontrib><creatorcontrib>Dove, Andrew Philip</creatorcontrib><creatorcontrib>Peck, Joseph E</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Soni, Ritesh K</au><au>Moeller, Jan Viborg</au><au>Dove, Andrew Philip</au><au>Peck, Joseph E</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test Abstraction Data Model</title><date>2023-08-24</date><risdate>2023</risdate><abstract>Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Test Abstraction Data Model
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T10%3A43%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Soni,%20Ritesh%20K&rft.date=2023-08-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023266390A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true