SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS

A semiconductor apparatus includes a temperature detecting circuit and a temperature raising circuit. The temperature detecting circuit detects a temperature to generate temperature detection information. The temperature raising circuit generates heat through a toggling operation based on the temper...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YOON, Hyun Ju, CHUN, Jun Hyun, KANG, Min, KO, Dong Uc, OH, Young Su, KIM, Dong Keun
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YOON, Hyun Ju
CHUN, Jun Hyun
KANG, Min
KO, Dong Uc
OH, Young Su
KIM, Dong Keun
description A semiconductor apparatus includes a temperature detecting circuit and a temperature raising circuit. The temperature detecting circuit detects a temperature to generate temperature detection information. The temperature raising circuit generates heat through a toggling operation based on the temperature detection information.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023253026A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023253026A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023253026A13</originalsourceid><addsrcrecordid>eNrjZLAKdvX1dPb3cwl1DvEPUnAMCHAMcgwJDVZw9HNRQJXzdfX1D4pEKOFhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRsZGpsYGRmaOhsbEqQIAmRwqcw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS</title><source>esp@cenet</source><creator>YOON, Hyun Ju ; CHUN, Jun Hyun ; KANG, Min ; KO, Dong Uc ; OH, Young Su ; KIM, Dong Keun</creator><creatorcontrib>YOON, Hyun Ju ; CHUN, Jun Hyun ; KANG, Min ; KO, Dong Uc ; OH, Young Su ; KIM, Dong Keun</creatorcontrib><description>A semiconductor apparatus includes a temperature detecting circuit and a temperature raising circuit. The temperature detecting circuit detects a temperature to generate temperature detection information. The temperature raising circuit generates heat through a toggling operation based on the temperature detection information.</description><language>eng</language><subject>INFORMATION STORAGE ; MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; STATIC STORES ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230810&amp;DB=EPODOC&amp;CC=US&amp;NR=2023253026A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230810&amp;DB=EPODOC&amp;CC=US&amp;NR=2023253026A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YOON, Hyun Ju</creatorcontrib><creatorcontrib>CHUN, Jun Hyun</creatorcontrib><creatorcontrib>KANG, Min</creatorcontrib><creatorcontrib>KO, Dong Uc</creatorcontrib><creatorcontrib>OH, Young Su</creatorcontrib><creatorcontrib>KIM, Dong Keun</creatorcontrib><title>SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS</title><description>A semiconductor apparatus includes a temperature detecting circuit and a temperature raising circuit. The temperature detecting circuit detects a temperature to generate temperature detection information. The temperature raising circuit generates heat through a toggling operation based on the temperature detection information.</description><subject>INFORMATION STORAGE</subject><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAKdvX1dPb3cwl1DvEPUnAMCHAMcgwJDVZw9HNRQJXzdfX1D4pEKOFhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRsZGpsYGRmaOhsbEqQIAmRwqcw</recordid><startdate>20230810</startdate><enddate>20230810</enddate><creator>YOON, Hyun Ju</creator><creator>CHUN, Jun Hyun</creator><creator>KANG, Min</creator><creator>KO, Dong Uc</creator><creator>OH, Young Su</creator><creator>KIM, Dong Keun</creator><scope>EVB</scope></search><sort><creationdate>20230810</creationdate><title>SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS</title><author>YOON, Hyun Ju ; CHUN, Jun Hyun ; KANG, Min ; KO, Dong Uc ; OH, Young Su ; KIM, Dong Keun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023253026A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>INFORMATION STORAGE</topic><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>YOON, Hyun Ju</creatorcontrib><creatorcontrib>CHUN, Jun Hyun</creatorcontrib><creatorcontrib>KANG, Min</creatorcontrib><creatorcontrib>KO, Dong Uc</creatorcontrib><creatorcontrib>OH, Young Su</creatorcontrib><creatorcontrib>KIM, Dong Keun</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YOON, Hyun Ju</au><au>CHUN, Jun Hyun</au><au>KANG, Min</au><au>KO, Dong Uc</au><au>OH, Young Su</au><au>KIM, Dong Keun</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS</title><date>2023-08-10</date><risdate>2023</risdate><abstract>A semiconductor apparatus includes a temperature detecting circuit and a temperature raising circuit. The temperature detecting circuit detects a temperature to generate temperature detection information. The temperature raising circuit generates heat through a toggling operation based on the temperature detection information.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2023253026A1
source esp@cenet
subjects INFORMATION STORAGE
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
STATIC STORES
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
title SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR MEMORY APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T10%3A54%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YOON,%20Hyun%20Ju&rft.date=2023-08-10&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023253026A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true