ELECTRON MICROSCOPE WITH IMPROVED IMAGING RESOLUTION

Disclosed herein are electron microscopes with improved imaging. An example electron microscope at least includes an illumination system, for directing a beam of electrons to irradiate a specimen, an elongate beam conduit, through which the beam of electrons is directed; a multipole lens assembly co...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Dona, Pleun, Henstra, Alexander
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
Online-Zugang:	Volltext bestellen
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