MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES

Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to dir...

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Hauptverfasser: Ho, Tatt Wei, Cocker, Eric, Burns, Laurie D, Ghosh, Kunal, El Gamal, Abbas, Schnitzer, Mark J
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creator Ho, Tatt Wei
Cocker, Eric
Burns, Laurie D
Ghosh, Kunal
El Gamal, Abbas
Schnitzer, Mark J
description Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm2 and to direct epi-fluorescence emission caused by the excitation light to the array of optical sensors. The optical arrangement and array of optical sensors are each sufficiently close to the target object to provide at least 2.5 μm resolution for an image of the field of view.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023200656A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023200656A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023200656A13</originalsourceid><addsrcrecordid>eNrjZLDy9XQO8g929g-IVPD0dXT39HNXcHEN83R2VQj3DPFQcHQJc_RzdnWBSwYE-Qe4BoV4ugbzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAyNjIwMDM1MzR0Nj4lQBAF6cKfg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES</title><source>esp@cenet</source><creator>Ho, Tatt Wei ; Cocker, Eric ; Burns, Laurie D ; Ghosh, Kunal ; El Gamal, Abbas ; Schnitzer, Mark J</creator><creatorcontrib>Ho, Tatt Wei ; Cocker, Eric ; Burns, Laurie D ; Ghosh, Kunal ; El Gamal, Abbas ; Schnitzer, Mark J</creatorcontrib><description>Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm2 and to direct epi-fluorescence emission caused by the excitation light to the array of optical sensors. The optical arrangement and array of optical sensors are each sufficiently close to the target object to provide at least 2.5 μm resolution for an image of the field of view.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DIAGNOSIS ; ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; HUMAN NECESSITIES ; HYGIENE ; IDENTIFICATION ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEDICAL OR VETERINARY SCIENCE ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; SURGERY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230629&amp;DB=EPODOC&amp;CC=US&amp;NR=2023200656A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230629&amp;DB=EPODOC&amp;CC=US&amp;NR=2023200656A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ho, Tatt Wei</creatorcontrib><creatorcontrib>Cocker, Eric</creatorcontrib><creatorcontrib>Burns, Laurie D</creatorcontrib><creatorcontrib>Ghosh, Kunal</creatorcontrib><creatorcontrib>El Gamal, Abbas</creatorcontrib><creatorcontrib>Schnitzer, Mark J</creatorcontrib><title>MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES</title><description>Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm2 and to direct epi-fluorescence emission caused by the excitation light to the array of optical sensors. The optical arrangement and array of optical sensors are each sufficiently close to the target object to provide at least 2.5 μm resolution for an image of the field of view.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DIAGNOSIS</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>HUMAN NECESSITIES</subject><subject>HYGIENE</subject><subject>IDENTIFICATION</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEDICAL OR VETERINARY SCIENCE</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>SURGERY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDy9XQO8g929g-IVPD0dXT39HNXcHEN83R2VQj3DPFQcHQJc_RzdnWBSwYE-Qe4BoV4ugbzMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAyNjIwMDM1MzR0Nj4lQBAF6cKfg</recordid><startdate>20230629</startdate><enddate>20230629</enddate><creator>Ho, Tatt Wei</creator><creator>Cocker, Eric</creator><creator>Burns, Laurie D</creator><creator>Ghosh, Kunal</creator><creator>El Gamal, Abbas</creator><creator>Schnitzer, Mark J</creator><scope>EVB</scope></search><sort><creationdate>20230629</creationdate><title>MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES</title><author>Ho, Tatt Wei ; Cocker, Eric ; Burns, Laurie D ; Ghosh, Kunal ; El Gamal, Abbas ; Schnitzer, Mark J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023200656A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DIAGNOSIS</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>HUMAN NECESSITIES</topic><topic>HYGIENE</topic><topic>IDENTIFICATION</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEDICAL OR VETERINARY SCIENCE</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>SURGERY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Ho, Tatt Wei</creatorcontrib><creatorcontrib>Cocker, Eric</creatorcontrib><creatorcontrib>Burns, Laurie D</creatorcontrib><creatorcontrib>Ghosh, Kunal</creatorcontrib><creatorcontrib>El Gamal, Abbas</creatorcontrib><creatorcontrib>Schnitzer, Mark J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ho, Tatt Wei</au><au>Cocker, Eric</au><au>Burns, Laurie D</au><au>Ghosh, Kunal</au><au>El Gamal, Abbas</au><au>Schnitzer, Mark J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES</title><date>2023-06-29</date><risdate>2023</risdate><abstract>Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm2 and to direct epi-fluorescence emission caused by the excitation light to the array of optical sensors. The optical arrangement and array of optical sensors are each sufficiently close to the target object to provide at least 2.5 μm resolution for an image of the field of view.</abstract><oa>free_for_read</oa></addata></record>
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source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
DIAGNOSIS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEDICAL OR VETERINARY SCIENCE
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
SURGERY
TESTING
title MICROSCOPY IMAGING DEVICE WITH ADVANCED IMAGING PROPERTIES
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