MULTI-STAGE ERASE OPERATION OF MEMORY CELLS IN A MEMORY SUB-SYSTEM
Control logic in a memory device executes a programming operation to program a memory cell of a set of memory cells to a programming level. A first erase sub-operation is executed to erase the memory cell to a first threshold voltage level, the first erase sub-operation including applying, to the me...
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creator | Lu, Ching-Huang Dong, Yingda Ratnam, Sampath K |
description | Control logic in a memory device executes a programming operation to program a memory cell of a set of memory cells to a programming level. A first erase sub-operation is executed to erase the memory cell to a first threshold voltage level, the first erase sub-operation including applying, to the memory cell, a first erase pulse having a first erase voltage level. A second erase sub-operation is executed to erase the memory cell to a second threshold voltage level, the second erase sub-operation including applying, to the memory cell, a second erase pulse having a second erase voltage level, where the first erase voltage level of the first erase pulse is lower than the second erase voltage level of the second erase pulse. |
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A first erase sub-operation is executed to erase the memory cell to a first threshold voltage level, the first erase sub-operation including applying, to the memory cell, a first erase pulse having a first erase voltage level. A second erase sub-operation is executed to erase the memory cell to a second threshold voltage level, the second erase sub-operation including applying, to the memory cell, a second erase pulse having a second erase voltage level, where the first erase voltage level of the first erase pulse is lower than the second erase voltage level of the second erase pulse.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230622&DB=EPODOC&CC=US&NR=2023195328A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230622&DB=EPODOC&CC=US&NR=2023195328A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Lu, Ching-Huang</creatorcontrib><creatorcontrib>Dong, Yingda</creatorcontrib><creatorcontrib>Ratnam, Sampath K</creatorcontrib><title>MULTI-STAGE ERASE OPERATION OF MEMORY CELLS IN A MEMORY SUB-SYSTEM</title><description>Control logic in a memory device executes a programming operation to program a memory cell of a set of memory cells to a programming level. 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A second erase sub-operation is executed to erase the memory cell to a second threshold voltage level, the second erase sub-operation including applying, to the memory cell, a second erase pulse having a second erase voltage level, where the first erase voltage level of the first erase pulse is lower than the second erase voltage level of the second erase pulse.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHDyDfUJ8dQNDnF0d1VwDXIMdlXwDwDSIZ7-fgr-bgq-rr7-QZEKzq4-PsEKnn4KjjCR4FAn3eDI4BBXXx4G1rTEnOJUXijNzaDs5hri7KGbWpAfn1pckJicmpdaEh8abGRgZGxoaWpsZOFoaEycKgCoPCwe</recordid><startdate>20230622</startdate><enddate>20230622</enddate><creator>Lu, Ching-Huang</creator><creator>Dong, Yingda</creator><creator>Ratnam, Sampath K</creator><scope>EVB</scope></search><sort><creationdate>20230622</creationdate><title>MULTI-STAGE ERASE OPERATION OF MEMORY CELLS IN A MEMORY SUB-SYSTEM</title><author>Lu, Ching-Huang ; Dong, Yingda ; Ratnam, Sampath K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023195328A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Lu, Ching-Huang</creatorcontrib><creatorcontrib>Dong, Yingda</creatorcontrib><creatorcontrib>Ratnam, Sampath K</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lu, Ching-Huang</au><au>Dong, Yingda</au><au>Ratnam, Sampath K</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MULTI-STAGE ERASE OPERATION OF MEMORY CELLS IN A MEMORY SUB-SYSTEM</title><date>2023-06-22</date><risdate>2023</risdate><abstract>Control logic in a memory device executes a programming operation to program a memory cell of a set of memory cells to a programming level. A first erase sub-operation is executed to erase the memory cell to a first threshold voltage level, the first erase sub-operation including applying, to the memory cell, a first erase pulse having a first erase voltage level. A second erase sub-operation is executed to erase the memory cell to a second threshold voltage level, the second erase sub-operation including applying, to the memory cell, a second erase pulse having a second erase voltage level, where the first erase voltage level of the first erase pulse is lower than the second erase voltage level of the second erase pulse.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
title | MULTI-STAGE ERASE OPERATION OF MEMORY CELLS IN A MEMORY SUB-SYSTEM |
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