CROWD-SOURCED HARDWARE CALIBRATION

CROWD-SOURCED HARDWARE CALIBRATION

Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KESSLER, Joshua C, WOJTOWICZ, Marek A, SOLOMON, Peter R, RUBENSTEIN, Yonatan B, RUBENSTEIN, Eric P, DRUKIER, Gordon A
Format: Patent
Sprache:eng
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KESSLER, Joshua C
WOJTOWICZ, Marek A
SOLOMON, Peter R
RUBENSTEIN, Yonatan B
RUBENSTEIN, Eric P
DRUKIER, Gordon A
description Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023152478A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023152478A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023152478A13</originalsourceid><addsrcrecordid>eNrjZFByDvIPd9EN9g8NcnZ1UfBwDHIJdwxyVXB29PF0CnIM8fT342FgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGxoamRibmFo6GxsSpAgDK7iN4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CROWD-SOURCED HARDWARE CALIBRATION</title><source>esp@cenet</source><creator>KESSLER, Joshua C ; WOJTOWICZ, Marek A ; SOLOMON, Peter R ; RUBENSTEIN, Yonatan B ; RUBENSTEIN, Eric P ; DRUKIER, Gordon A</creator><creatorcontrib>KESSLER, Joshua C ; WOJTOWICZ, Marek A ; SOLOMON, Peter R ; RUBENSTEIN, Yonatan B ; RUBENSTEIN, Eric P ; DRUKIER, Gordon A</creatorcontrib><description>Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.</description><language>eng</language><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230518&amp;DB=EPODOC&amp;CC=US&amp;NR=2023152478A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230518&amp;DB=EPODOC&amp;CC=US&amp;NR=2023152478A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KESSLER, Joshua C</creatorcontrib><creatorcontrib>WOJTOWICZ, Marek A</creatorcontrib><creatorcontrib>SOLOMON, Peter R</creatorcontrib><creatorcontrib>RUBENSTEIN, Yonatan B</creatorcontrib><creatorcontrib>RUBENSTEIN, Eric P</creatorcontrib><creatorcontrib>DRUKIER, Gordon A</creatorcontrib><title>CROWD-SOURCED HARDWARE CALIBRATION</title><description>Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.</description><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFByDvIPd9EN9g8NcnZ1UfBwDHIJdwxyVXB29PF0CnIM8fT342FgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGxoamRibmFo6GxsSpAgDK7iN4</recordid><startdate>20230518</startdate><enddate>20230518</enddate><creator>KESSLER, Joshua C</creator><creator>WOJTOWICZ, Marek A</creator><creator>SOLOMON, Peter R</creator><creator>RUBENSTEIN, Yonatan B</creator><creator>RUBENSTEIN, Eric P</creator><creator>DRUKIER, Gordon A</creator><scope>EVB</scope></search><sort><creationdate>20230518</creationdate><title>CROWD-SOURCED HARDWARE CALIBRATION</title><author>KESSLER, Joshua C ; WOJTOWICZ, Marek A ; SOLOMON, Peter R ; RUBENSTEIN, Yonatan B ; RUBENSTEIN, Eric P ; DRUKIER, Gordon A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023152478A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KESSLER, Joshua C</creatorcontrib><creatorcontrib>WOJTOWICZ, Marek A</creatorcontrib><creatorcontrib>SOLOMON, Peter R</creatorcontrib><creatorcontrib>RUBENSTEIN, Yonatan B</creatorcontrib><creatorcontrib>RUBENSTEIN, Eric P</creatorcontrib><creatorcontrib>DRUKIER, Gordon A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KESSLER, Joshua C</au><au>WOJTOWICZ, Marek A</au><au>SOLOMON, Peter R</au><au>RUBENSTEIN, Yonatan B</au><au>RUBENSTEIN, Eric P</au><au>DRUKIER, Gordon A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CROWD-SOURCED HARDWARE CALIBRATION</title><date>2023-05-18</date><risdate>2023</risdate><abstract>Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2023152478A1
source esp@cenet
subjects MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
title CROWD-SOURCED HARDWARE CALIBRATION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T06%3A17%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KESSLER,%20Joshua%20C&rft.date=2023-05-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023152478A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true