METHODS AND APPARATUSES FOR STRAY FIELD COMPENSATION NORMAL TO A SURFACE ELECTRODE ION TRAP

Aspects of the present disclosure may include a method and/or a system for applying, to one or more surface electrode trapped ions, a first electric field in a first direction, applying, to the one or more surface electrode trapped ions, a plurality of second electric fields in a second direction wh...

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Bibliographische Detailangaben
Hauptverfasser: WEST, Adam Daniel, MIZRAHI, Jonathan Albert, GOLDMAN, Michael Lurie, UYS, Hermann
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Aspects of the present disclosure may include a method and/or a system for applying, to one or more surface electrode trapped ions, a first electric field in a first direction, applying, to the one or more surface electrode trapped ions, a plurality of second electric fields in a second direction while applying the first electric field, wherein the second direction is substantially orthogonal to the first direction, measuring, for each of the plurality of second electric fields, a corresponding micromotion signal associated with the application of one or more of the first electric field or one of the plurality of second electric fields, identifying a maximum micromotion signal of a plurality of micromotion signals associated with the plurality of second electric fields, and identifying a compensation field associated with the maximum micromotion signal.