BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP

In various examples, a VPU and associated components may be optimized to improve VPU performance and throughput. For example, the VPU may include a min/max collector, automatic store predication functionality, a SIMD data path organization that allows for inter-lane sharing, a transposed load/store...

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Hauptverfasser: Sankaran, Jagadeesh, Itani, Ahmad, Shih, Yen-Te, Hung, Ching-Yu, Singh, Ravi P
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Itani, Ahmad
Shih, Yen-Te
Hung, Ching-Yu
Singh, Ravi P
description In various examples, a VPU and associated components may be optimized to improve VPU performance and throughput. For example, the VPU may include a min/max collector, automatic store predication functionality, a SIMD data path organization that allows for inter-lane sharing, a transposed load/store with stride parameter functionality, a load with permute and zero insertion functionality, hardware, logic, and memory layout functionality to allow for two point and two by two point lookups, and per memory bank load caching capabilities. In addition, decoupled accelerators may be used to offload VPU processing tasks to increase throughput and performance, and a hardware sequencer may be included in a DMA system to reduce programming complexity of the VPU and the DMA system. The DMA and VPU may execute a VPU configuration mode that allows the VPU and DMA to operate without a processing controller for performing dynamic region based data movement operations.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023125397A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023125397A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023125397A13</originalsourceid><addsrcrecordid>eNrjZPBzCvX0CdH19FMIdvVx0w1xDQ5RcPMPUnBUCAjydw9y9PV1dPJxVQjzDPb091NwdHZ29XENcgwBqvB3AyoKjgwOcfVVAEkpOHt4BvAwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDI2NDI1NjS3NHQ2PiVAEAj5Qu4w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP</title><source>esp@cenet</source><creator>Sankaran, Jagadeesh ; Itani, Ahmad ; Shih, Yen-Te ; Hung, Ching-Yu ; Singh, Ravi P</creator><creatorcontrib>Sankaran, Jagadeesh ; Itani, Ahmad ; Shih, Yen-Te ; Hung, Ching-Yu ; Singh, Ravi P</creatorcontrib><description>In various examples, a VPU and associated components may be optimized to improve VPU performance and throughput. For example, the VPU may include a min/max collector, automatic store predication functionality, a SIMD data path organization that allows for inter-lane sharing, a transposed load/store with stride parameter functionality, a load with permute and zero insertion functionality, hardware, logic, and memory layout functionality to allow for two point and two by two point lookups, and per memory bank load caching capabilities. In addition, decoupled accelerators may be used to offload VPU processing tasks to increase throughput and performance, and a hardware sequencer may be included in a DMA system to reduce programming complexity of the VPU and the DMA system. The DMA and VPU may execute a VPU configuration mode that allows the VPU and DMA to operate without a processing controller for performing dynamic region based data movement operations.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; CODE CONVERSION IN GENERAL ; CODING ; COMPUTING ; COUNTING ; DECODING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230427&amp;DB=EPODOC&amp;CC=US&amp;NR=2023125397A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230427&amp;DB=EPODOC&amp;CC=US&amp;NR=2023125397A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Sankaran, Jagadeesh</creatorcontrib><creatorcontrib>Itani, Ahmad</creatorcontrib><creatorcontrib>Shih, Yen-Te</creatorcontrib><creatorcontrib>Hung, Ching-Yu</creatorcontrib><creatorcontrib>Singh, Ravi P</creatorcontrib><title>BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP</title><description>In various examples, a VPU and associated components may be optimized to improve VPU performance and throughput. For example, the VPU may include a min/max collector, automatic store predication functionality, a SIMD data path organization that allows for inter-lane sharing, a transposed load/store with stride parameter functionality, a load with permute and zero insertion functionality, hardware, logic, and memory layout functionality to allow for two point and two by two point lookups, and per memory bank load caching capabilities. In addition, decoupled accelerators may be used to offload VPU processing tasks to increase throughput and performance, and a hardware sequencer may be included in a DMA system to reduce programming complexity of the VPU and the DMA system. The DMA and VPU may execute a VPU configuration mode that allows the VPU and DMA to operate without a processing controller for performing dynamic region based data movement operations.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DECODING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPBzCvX0CdH19FMIdvVx0w1xDQ5RcPMPUnBUCAjydw9y9PV1dPJxVQjzDPb091NwdHZ29XENcgwBqvB3AyoKjgwOcfVVAEkpOHt4BvAwsKYl5hSn8kJpbgZlN9cQZw_d1IL8-NTigsTk1LzUkvjQYCMDI2NDI1NjS3NHQ2PiVAEAj5Qu4w</recordid><startdate>20230427</startdate><enddate>20230427</enddate><creator>Sankaran, Jagadeesh</creator><creator>Itani, Ahmad</creator><creator>Shih, Yen-Te</creator><creator>Hung, Ching-Yu</creator><creator>Singh, Ravi P</creator><scope>EVB</scope></search><sort><creationdate>20230427</creationdate><title>BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP</title><author>Sankaran, Jagadeesh ; Itani, Ahmad ; Shih, Yen-Te ; Hung, Ching-Yu ; Singh, Ravi P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023125397A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DECODING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Sankaran, Jagadeesh</creatorcontrib><creatorcontrib>Itani, Ahmad</creatorcontrib><creatorcontrib>Shih, Yen-Te</creatorcontrib><creatorcontrib>Hung, Ching-Yu</creatorcontrib><creatorcontrib>Singh, Ravi P</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sankaran, Jagadeesh</au><au>Itani, Ahmad</au><au>Shih, Yen-Te</au><au>Hung, Ching-Yu</au><au>Singh, Ravi P</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP</title><date>2023-04-27</date><risdate>2023</risdate><abstract>In various examples, a VPU and associated components may be optimized to improve VPU performance and throughput. For example, the VPU may include a min/max collector, automatic store predication functionality, a SIMD data path organization that allows for inter-lane sharing, a transposed load/store with stride parameter functionality, a load with permute and zero insertion functionality, hardware, logic, and memory layout functionality to allow for two point and two by two point lookups, and per memory bank load caching capabilities. In addition, decoupled accelerators may be used to offload VPU processing tasks to increase throughput and performance, and a hardware sequencer may be included in a DMA system to reduce programming complexity of the VPU and the DMA system. The DMA and VPU may execute a VPU configuration mode that allows the VPU and DMA to operate without a processing controller for performing dynamic region based data movement operations.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRONIC CIRCUITRY
CALCULATING
CODE CONVERSION IN GENERAL
CODING
COMPUTING
COUNTING
DECODING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRICITY
PHYSICS
title BUILT-IN SELF-TEST FOR A PROGRAMMABLE VISION ACCELERATOR OF A SYSTEM ON A CHIP
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T22%3A20%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Sankaran,%20Jagadeesh&rft.date=2023-04-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023125397A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true