COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS

An extraction assembly may include an extraction plate for placement along a side of a plasma chamber, and having an extraction aperture, elongated along a first direction, and having an aperture height, extending along a second direction, perpendicular to the first direction. The extraction plate d...

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Hauptverfasser: Anglin, Kevin R, Rockwell, Tyler, Biloiu, Costel, Basame, Solomon Belangedi, Wallace, Jay R
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creator Anglin, Kevin R
Rockwell, Tyler
Biloiu, Costel
Basame, Solomon Belangedi
Wallace, Jay R
description An extraction assembly may include an extraction plate for placement along a side of a plasma chamber, and having an extraction aperture, elongated along a first direction, and having an aperture height, extending along a second direction, perpendicular to the first direction. The extraction plate defines an inner surface along the extraction aperture, lying in a first plane. A beam blocker is disposed over the extraction aperture, and has an outer surface, disposed in a second plane, different than the first plane. As such, the beam blocker overlaps with the extraction plate along a first edge of the extraction aperture by a first overlap distance, and overlaps with the extraction plate along a second edge of the extraction aperture by a second overlap distance, so as to define a first extraction slit, along the first edge, and a second extraction slit along the second edge.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023124509A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023124509A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023124509A13</originalsourceid><addsrcrecordid>eNrjZHB39vcNcHQOUfDxD1dw9HP3cVXw9PdTcHJ19FVwjQgJAkqB-I7Bwa6-Tj6RQCUuCgFB_s6uwcGefu4KjgEBjkGOIaHBPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7UkPjTYyMDI2NDIxNTA0tHQmDhVAH_CLXc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS</title><source>esp@cenet</source><creator>Anglin, Kevin R ; Rockwell, Tyler ; Biloiu, Costel ; Basame, Solomon Belangedi ; Wallace, Jay R</creator><creatorcontrib>Anglin, Kevin R ; Rockwell, Tyler ; Biloiu, Costel ; Basame, Solomon Belangedi ; Wallace, Jay R</creatorcontrib><description>An extraction assembly may include an extraction plate for placement along a side of a plasma chamber, and having an extraction aperture, elongated along a first direction, and having an aperture height, extending along a second direction, perpendicular to the first direction. The extraction plate defines an inner surface along the extraction aperture, lying in a first plane. A beam blocker is disposed over the extraction aperture, and has an outer surface, disposed in a second plane, different than the first plane. As such, the beam blocker overlaps with the extraction plate along a first edge of the extraction aperture by a first overlap distance, and overlaps with the extraction plate along a second edge of the extraction aperture by a second overlap distance, so as to define a first extraction slit, along the first edge, and a second extraction slit along the second edge.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230420&amp;DB=EPODOC&amp;CC=US&amp;NR=2023124509A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230420&amp;DB=EPODOC&amp;CC=US&amp;NR=2023124509A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Anglin, Kevin R</creatorcontrib><creatorcontrib>Rockwell, Tyler</creatorcontrib><creatorcontrib>Biloiu, Costel</creatorcontrib><creatorcontrib>Basame, Solomon Belangedi</creatorcontrib><creatorcontrib>Wallace, Jay R</creatorcontrib><title>COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS</title><description>An extraction assembly may include an extraction plate for placement along a side of a plasma chamber, and having an extraction aperture, elongated along a first direction, and having an aperture height, extending along a second direction, perpendicular to the first direction. The extraction plate defines an inner surface along the extraction aperture, lying in a first plane. A beam blocker is disposed over the extraction aperture, and has an outer surface, disposed in a second plane, different than the first plane. As such, the beam blocker overlaps with the extraction plate along a first edge of the extraction aperture by a first overlap distance, and overlaps with the extraction plate along a second edge of the extraction aperture by a second overlap distance, so as to define a first extraction slit, along the first edge, and a second extraction slit along the second edge.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHB39vcNcHQOUfDxD1dw9HP3cVXw9PdTcHJ19FVwjQgJAkqB-I7Bwa6-Tj6RQCUuCgFB_s6uwcGefu4KjgEBjkGOIaHBPAysaYk5xam8UJqbQdnNNcTZQze1ID8-tbggMTk1L7UkPjTYyMDI2NDIxNTA0tHQmDhVAH_CLXc</recordid><startdate>20230420</startdate><enddate>20230420</enddate><creator>Anglin, Kevin R</creator><creator>Rockwell, Tyler</creator><creator>Biloiu, Costel</creator><creator>Basame, Solomon Belangedi</creator><creator>Wallace, Jay R</creator><scope>EVB</scope></search><sort><creationdate>20230420</creationdate><title>COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS</title><author>Anglin, Kevin R ; Rockwell, Tyler ; Biloiu, Costel ; Basame, Solomon Belangedi ; Wallace, Jay R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023124509A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Anglin, Kevin R</creatorcontrib><creatorcontrib>Rockwell, Tyler</creatorcontrib><creatorcontrib>Biloiu, Costel</creatorcontrib><creatorcontrib>Basame, Solomon Belangedi</creatorcontrib><creatorcontrib>Wallace, Jay R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Anglin, Kevin R</au><au>Rockwell, Tyler</au><au>Biloiu, Costel</au><au>Basame, Solomon Belangedi</au><au>Wallace, Jay R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS</title><date>2023-04-20</date><risdate>2023</risdate><abstract>An extraction assembly may include an extraction plate for placement along a side of a plasma chamber, and having an extraction aperture, elongated along a first direction, and having an aperture height, extending along a second direction, perpendicular to the first direction. The extraction plate defines an inner surface along the extraction aperture, lying in a first plane. A beam blocker is disposed over the extraction aperture, and has an outer surface, disposed in a second plane, different than the first plane. As such, the beam blocker overlaps with the extraction plate along a first edge of the extraction aperture by a first overlap distance, and overlaps with the extraction plate along a second edge of the extraction aperture by a second overlap distance, so as to define a first extraction slit, along the first edge, and a second extraction slit along the second edge.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title COMPACT LOW ANGLE ION BEAM EXTRACTION ASSEMBLY AND PROCESSING APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T19%3A39%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Anglin,%20Kevin%20R&rft.date=2023-04-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023124509A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true