SYSTEM FOR AT LEAST ONE OF CALIBRATION OR QUALITY CONTROL OF AN FFS X-RAY SYSTEM

One or more example embodiments relates to a system for calibration and/or for quality control of an FFS X-ray system, a corresponding FFS X-ray system, a control facility suitable for it and to a method for calibration and/or for quality control of the FFS X-ray system.

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Bibliographische Detailangaben
1. Verfasser: RADICKE, Marcus
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:One or more example embodiments relates to a system for calibration and/or for quality control of an FFS X-ray system, a corresponding FFS X-ray system, a control facility suitable for it and to a method for calibration and/or for quality control of the FFS X-ray system.