AUTOMATED TEST EQUIPMENT FOR TESTING SEMICONDUCTOR DEVICES

AUTOMATED TEST EQUIPMENT FOR TESTING SEMICONDUCTOR DEVICES

An automated test equipment (ATE) for testing semiconductor devices, the test equipment comprises a test handler, a spare part, or a contactor socket, and a semiconductor devices tester, The spare part comprises an electronic component for storing and or processing data regarding the spare part or a...

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Hauptverfasser: WHYTE, Alan, LUDWIG, Kevin, WAGNER, Markus, PÖTZINGER, Johann, FELTEN, Justin
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator WHYTE, Alan
LUDWIG, Kevin
WAGNER, Markus
PÖTZINGER, Johann
FELTEN, Justin
description An automated test equipment (ATE) for testing semiconductor devices, the test equipment comprises a test handler, a spare part, or a contactor socket, and a semiconductor devices tester, The spare part comprises an electronic component for storing and or processing data regarding the spare part or a portion thereof, The test equipment comprises an operator terminal comprising a display or GUI and a data exchange interface which is connected or connectable to the electronic component within the spare part, for at least displaying data stored therein. The ATE further comprises a data buffer unit for buffering the data, a maintenance planning and control unit for planning and controlling maintenance actions of the test equipment, and a dedicated database residing in a control computer.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title AUTOMATED TEST EQUIPMENT FOR TESTING SEMICONDUCTOR DEVICES
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