DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY
A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | STOICA, Dan-Ioan-Dumitru WINKLER, Bernhard BUFFA, Cesare POPESCU-STROE, Victor CASPANI, Alessandro CRISU, Constantin |
description | A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a capacitor having a capacitance that changes with a change in a distance between the first electrode structure and second electrode structure; a signal generator configured to apply an electrical signal at an input or at an output of the capacitor to induce a voltage transient response at the output of capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a time constant of the first voltage transient response and detecting the fault based on the time constant and based on whether the first electrical signal is the pull-in signal or the non-pull-in signal. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023064937A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023064937A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023064937A13</originalsourceid><addsrcrecordid>eNrjZAh0cQ1xdQ7x9HNXCHb1C_YM8QzzDIlUcHMM9QkJVvD0U3B2DHB0Bgm7ghX4BwUrOEUqhAaDdASE-vjoAtW4hfoBjfD3c_QB6uVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRsYGZiaWxuaOhsbEqQIAowQwzQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY</title><source>esp@cenet</source><creator>STOICA, Dan-Ioan-Dumitru ; WINKLER, Bernhard ; BUFFA, Cesare ; POPESCU-STROE, Victor ; CASPANI, Alessandro ; CRISU, Constantin</creator><creatorcontrib>STOICA, Dan-Ioan-Dumitru ; WINKLER, Bernhard ; BUFFA, Cesare ; POPESCU-STROE, Victor ; CASPANI, Alessandro ; CRISU, Constantin</creatorcontrib><description>A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a capacitor having a capacitance that changes with a change in a distance between the first electrode structure and second electrode structure; a signal generator configured to apply an electrical signal at an input or at an output of the capacitor to induce a voltage transient response at the output of capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a time constant of the first voltage transient response and detecting the fault based on the time constant and based on whether the first electrical signal is the pull-in signal or the non-pull-in signal.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230302&DB=EPODOC&CC=US&NR=2023064937A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,782,887,25573,76557</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230302&DB=EPODOC&CC=US&NR=2023064937A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STOICA, Dan-Ioan-Dumitru</creatorcontrib><creatorcontrib>WINKLER, Bernhard</creatorcontrib><creatorcontrib>BUFFA, Cesare</creatorcontrib><creatorcontrib>POPESCU-STROE, Victor</creatorcontrib><creatorcontrib>CASPANI, Alessandro</creatorcontrib><creatorcontrib>CRISU, Constantin</creatorcontrib><title>DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY</title><description>A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a capacitor having a capacitance that changes with a change in a distance between the first electrode structure and second electrode structure; a signal generator configured to apply an electrical signal at an input or at an output of the capacitor to induce a voltage transient response at the output of capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a time constant of the first voltage transient response and detecting the fault based on the time constant and based on whether the first electrical signal is the pull-in signal or the non-pull-in signal.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAh0cQ1xdQ7x9HNXCHb1C_YM8QzzDIlUcHMM9QkJVvD0U3B2DHB0Bgm7ghX4BwUrOEUqhAaDdASE-vjoAtW4hfoBjfD3c_QB6uVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRsYGZiaWxuaOhsbEqQIAowQwzQ</recordid><startdate>20230302</startdate><enddate>20230302</enddate><creator>STOICA, Dan-Ioan-Dumitru</creator><creator>WINKLER, Bernhard</creator><creator>BUFFA, Cesare</creator><creator>POPESCU-STROE, Victor</creator><creator>CASPANI, Alessandro</creator><creator>CRISU, Constantin</creator><scope>EVB</scope></search><sort><creationdate>20230302</creationdate><title>DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY</title><author>STOICA, Dan-Ioan-Dumitru ; WINKLER, Bernhard ; BUFFA, Cesare ; POPESCU-STROE, Victor ; CASPANI, Alessandro ; CRISU, Constantin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023064937A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>STOICA, Dan-Ioan-Dumitru</creatorcontrib><creatorcontrib>WINKLER, Bernhard</creatorcontrib><creatorcontrib>BUFFA, Cesare</creatorcontrib><creatorcontrib>POPESCU-STROE, Victor</creatorcontrib><creatorcontrib>CASPANI, Alessandro</creatorcontrib><creatorcontrib>CRISU, Constantin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STOICA, Dan-Ioan-Dumitru</au><au>WINKLER, Bernhard</au><au>BUFFA, Cesare</au><au>POPESCU-STROE, Victor</au><au>CASPANI, Alessandro</au><au>CRISU, Constantin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY</title><date>2023-03-02</date><risdate>2023</risdate><abstract>A capacitive sensor includes a first electrode structure; a second electrode structure that is counter to the first electrode structure, wherein the second electrode structure is movable relative to the first electrode structure and is capacitively coupled to the first electrode structure to form a capacitor having a capacitance that changes with a change in a distance between the first electrode structure and second electrode structure; a signal generator configured to apply an electrical signal at an input or at an output of the capacitor to induce a voltage transient response at the output of capacitor; and a diagnostic circuit configured to detect a fault in the capacitive sensor by measuring a time constant of the first voltage transient response and detecting the fault based on the time constant and based on whether the first electrical signal is the pull-in signal or the non-pull-in signal.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2023064937A1 |
source | esp@cenet |
subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | DETECTING SENSITIVITY FAULTS IN CAPACITIVE SENSORS BY USING PULL-IN FUNCTIONALITY |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-11-29T17%3A53%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STOICA,%20Dan-Ioan-Dumitru&rft.date=2023-03-02&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023064937A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |