DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM

A device, computer program, and computer-implemented method for determining a variable of a technical system. An input variable is determined for a first model for determining the variable at a first temporal resolution. A first time series is provided, at the first temporal resolution, including va...

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Hauptverfasser: Guersun, Gonca, Rakitsch, Barbara, Imhof, Volker, Engel, Patrick, Gerwinn, Sebastian
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creator Guersun, Gonca
Rakitsch, Barbara
Imhof, Volker
Engel, Patrick
Gerwinn, Sebastian
description A device, computer program, and computer-implemented method for determining a variable of a technical system. An input variable is determined for a first model for determining the variable at a first temporal resolution. A first time series is provided, at the first temporal resolution, including values which characterize an operating variable of the technical system. A second time series is provided. at a second temporal resolution, including values which characterize the operating variable of the technical system, the first and second temporal resolutions being different. The second time series is mapped using a second model for determining a first prediction for the variable of the technical system at the second temporal resolution on the first prediction. Parameters of a second model are determined, using the second time series, which are mapped on parameters of a third model at the first temporal resolution.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023041825A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023041825A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023041825A13</originalsourceid><addsrcrecordid>eNqNirsKwjAUQLM4iPoPF5wLbargGpMbeyGPkqQVp1IkTqKF-v_YwQ9wOhzOWbOrwp4kgnAKpLdtlzAUZFuDFl1CBRZT4xVoH0DhEi05chcQ0ItA4mwQvF4soWwcSWEg3mJCu2Wrx_ic8-7HDdtrTLIp8vQe8jyN9_zKn6GLvOR1eahO_Ciq-r_rC1k3MYY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM</title><source>esp@cenet</source><creator>Guersun, Gonca ; Rakitsch, Barbara ; Imhof, Volker ; Engel, Patrick ; Gerwinn, Sebastian</creator><creatorcontrib>Guersun, Gonca ; Rakitsch, Barbara ; Imhof, Volker ; Engel, Patrick ; Gerwinn, Sebastian</creatorcontrib><description>A device, computer program, and computer-implemented method for determining a variable of a technical system. An input variable is determined for a first model for determining the variable at a first temporal resolution. A first time series is provided, at the first temporal resolution, including values which characterize an operating variable of the technical system. A second time series is provided. at a second temporal resolution, including values which characterize the operating variable of the technical system, the first and second temporal resolutions being different. The second time series is mapped using a second model for determining a first prediction for the variable of the technical system at the second temporal resolution on the first prediction. Parameters of a second model are determined, using the second time series, which are mapped on parameters of a third model at the first temporal resolution.</description><language>eng</language><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MEASURING ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230209&amp;DB=EPODOC&amp;CC=US&amp;NR=2023041825A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230209&amp;DB=EPODOC&amp;CC=US&amp;NR=2023041825A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Guersun, Gonca</creatorcontrib><creatorcontrib>Rakitsch, Barbara</creatorcontrib><creatorcontrib>Imhof, Volker</creatorcontrib><creatorcontrib>Engel, Patrick</creatorcontrib><creatorcontrib>Gerwinn, Sebastian</creatorcontrib><title>DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM</title><description>A device, computer program, and computer-implemented method for determining a variable of a technical system. An input variable is determined for a first model for determining the variable at a first temporal resolution. A first time series is provided, at the first temporal resolution, including values which characterize an operating variable of the technical system. A second time series is provided. at a second temporal resolution, including values which characterize the operating variable of the technical system, the first and second temporal resolutions being different. The second time series is mapped using a second model for determining a first prediction for the variable of the technical system at the second temporal resolution on the first prediction. Parameters of a second model are determined, using the second time series, which are mapped on parameters of a third model at the first temporal resolution.</description><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MEASURING</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNirsKwjAUQLM4iPoPF5wLbargGpMbeyGPkqQVp1IkTqKF-v_YwQ9wOhzOWbOrwp4kgnAKpLdtlzAUZFuDFl1CBRZT4xVoH0DhEi05chcQ0ItA4mwQvF4soWwcSWEg3mJCu2Wrx_ic8-7HDdtrTLIp8vQe8jyN9_zKn6GLvOR1eahO_Ciq-r_rC1k3MYY</recordid><startdate>20230209</startdate><enddate>20230209</enddate><creator>Guersun, Gonca</creator><creator>Rakitsch, Barbara</creator><creator>Imhof, Volker</creator><creator>Engel, Patrick</creator><creator>Gerwinn, Sebastian</creator><scope>EVB</scope></search><sort><creationdate>20230209</creationdate><title>DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM</title><author>Guersun, Gonca ; Rakitsch, Barbara ; Imhof, Volker ; Engel, Patrick ; Gerwinn, Sebastian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023041825A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MEASURING</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Guersun, Gonca</creatorcontrib><creatorcontrib>Rakitsch, Barbara</creatorcontrib><creatorcontrib>Imhof, Volker</creatorcontrib><creatorcontrib>Engel, Patrick</creatorcontrib><creatorcontrib>Gerwinn, Sebastian</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Guersun, Gonca</au><au>Rakitsch, Barbara</au><au>Imhof, Volker</au><au>Engel, Patrick</au><au>Gerwinn, Sebastian</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM</title><date>2023-02-09</date><risdate>2023</risdate><abstract>A device, computer program, and computer-implemented method for determining a variable of a technical system. An input variable is determined for a first model for determining the variable at a first temporal resolution. A first time series is provided, at the first temporal resolution, including values which characterize an operating variable of the technical system. A second time series is provided. at a second temporal resolution, including values which characterize the operating variable of the technical system, the first and second temporal resolutions being different. The second time series is mapped using a second model for determining a first prediction for the variable of the technical system at the second temporal resolution on the first prediction. Parameters of a second model are determined, using the second time series, which are mapped on parameters of a third model at the first temporal resolution.</abstract><oa>free_for_read</oa></addata></record>
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subjects CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title DEVICE AND COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A VARIABLE OF A TECHNICAL SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T14%3A09%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Guersun,%20Gonca&rft.date=2023-02-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023041825A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true