DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM

A diagnostic apparatus includes circuitry to determine a process number based on operation information that changes in accordance with an operation of a machine being a subject of diagnosis, and determine a state of the machine using corresponding one of a plurality of model parameters corresponding...

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Hauptverfasser: NODA, Yuichi, HAGIWARA, Satoshi, TAKAMI, Junichi, AIBA, Akihito
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creator NODA, Yuichi
HAGIWARA, Satoshi
TAKAMI, Junichi
AIBA, Akihito
description A diagnostic apparatus includes circuitry to determine a process number based on operation information that changes in accordance with an operation of a machine being a subject of diagnosis, and determine a state of the machine using corresponding one of a plurality of model parameters corresponding to the determined process number and state information that changes in accordance with the state of the machine. The process number indicates an order of a particular process in a plurality of processes executed by the machine.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023037756A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023037756A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023037756A13</originalsourceid><addsrcrecordid>eNrjZLB18XR09_MPDvF0VnAMCHAMcgwJDdZRQBL1dQ3x8HfRUXD0c1EIcnX2D3Lx9HMHirp4hvryMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAyNjA2Nzc1MzR0Nj4lQBAMchKqM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM</title><source>esp@cenet</source><creator>NODA, Yuichi ; HAGIWARA, Satoshi ; TAKAMI, Junichi ; AIBA, Akihito</creator><creatorcontrib>NODA, Yuichi ; HAGIWARA, Satoshi ; TAKAMI, Junichi ; AIBA, Akihito</creatorcontrib><description>A diagnostic apparatus includes circuitry to determine a process number based on operation information that changes in accordance with an operation of a machine being a subject of diagnosis, and determine a state of the machine using corresponding one of a plurality of model parameters corresponding to the determined process number and state information that changes in accordance with the state of the machine. The process number indicates an order of a particular process in a plurality of processes executed by the machine.</description><language>eng</language><subject>MEASURING ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230209&amp;DB=EPODOC&amp;CC=US&amp;NR=2023037756A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230209&amp;DB=EPODOC&amp;CC=US&amp;NR=2023037756A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NODA, Yuichi</creatorcontrib><creatorcontrib>HAGIWARA, Satoshi</creatorcontrib><creatorcontrib>TAKAMI, Junichi</creatorcontrib><creatorcontrib>AIBA, Akihito</creatorcontrib><title>DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM</title><description>A diagnostic apparatus includes circuitry to determine a process number based on operation information that changes in accordance with an operation of a machine being a subject of diagnosis, and determine a state of the machine using corresponding one of a plurality of model parameters corresponding to the determined process number and state information that changes in accordance with the state of the machine. The process number indicates an order of a particular process in a plurality of processes executed by the machine.</description><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB18XR09_MPDvF0VnAMCHAMcgwJDdZRQBL1dQ3x8HfRUXD0c1EIcnX2D3Lx9HMHirp4hvryMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAyNjA2Nzc1MzR0Nj4lQBAMchKqM</recordid><startdate>20230209</startdate><enddate>20230209</enddate><creator>NODA, Yuichi</creator><creator>HAGIWARA, Satoshi</creator><creator>TAKAMI, Junichi</creator><creator>AIBA, Akihito</creator><scope>EVB</scope></search><sort><creationdate>20230209</creationdate><title>DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM</title><author>NODA, Yuichi ; HAGIWARA, Satoshi ; TAKAMI, Junichi ; AIBA, Akihito</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023037756A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>NODA, Yuichi</creatorcontrib><creatorcontrib>HAGIWARA, Satoshi</creatorcontrib><creatorcontrib>TAKAMI, Junichi</creatorcontrib><creatorcontrib>AIBA, Akihito</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NODA, Yuichi</au><au>HAGIWARA, Satoshi</au><au>TAKAMI, Junichi</au><au>AIBA, Akihito</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM</title><date>2023-02-09</date><risdate>2023</risdate><abstract>A diagnostic apparatus includes circuitry to determine a process number based on operation information that changes in accordance with an operation of a machine being a subject of diagnosis, and determine a state of the machine using corresponding one of a plurality of model parameters corresponding to the determined process number and state information that changes in accordance with the state of the machine. The process number indicates an order of a particular process in a plurality of processes executed by the machine.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title DIAGNOSTIC APPARATUS, DIAGNOSTIC METHOD, AND RECORDING MEDIUM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T20%3A34%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NODA,%20Yuichi&rft.date=2023-02-09&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023037756A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true