FAILURE DETECTION AND CORRECTION FOR LED ARRAYS

FAILURE DETECTION AND CORRECTION FOR LED ARRAYS

A micro light-emitting diode (μLED) array system can include an image post processor configured to translate received image data to pulse width modulation (PWM) and/or analog current control data, an input frame buffer configured to receive the control data, a plurality of individually controllable...

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Hauptverfasser: Bonne, Ronald Johannes, Vajapey, Sridhar
Format: Patent
Sprache:eng
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ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
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creator Bonne, Ronald Johannes
Vajapey, Sridhar
description A micro light-emitting diode (μLED) array system can include an image post processor configured to translate received image data to pulse width modulation (PWM) and/or analog current control data, an input frame buffer configured to receive the control data, a plurality of individually controllable μLEDS of a μLED array, a return frame buffer that receives data indicating a μLED electrical output characteristic including an output current, and compare circuitry configured to compare image data from the input and return frame buffers, and transfer comparison data to the image post processor, the image post processor configured to alter individual μLED control data based on the comparison data.
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ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR ; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230105&amp;DB=EPODOC&amp;CC=US&amp;NR=2023007751A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230105&amp;DB=EPODOC&amp;CC=US&amp;NR=2023007751A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bonne, Ronald Johannes</creatorcontrib><creatorcontrib>Vajapey, Sridhar</creatorcontrib><title>FAILURE DETECTION AND CORRECTION FOR LED ARRAYS</title><description>A micro light-emitting diode (μLED) array system can include an image post processor configured to translate received image data to pulse width modulation (PWM) and/or analog current control data, an input frame buffer configured to receive the control data, a plurality of individually controllable μLEDS of a μLED array, a return frame buffer that receives data indicating a μLED electrical output characteristic including an output current, and compare circuitry configured to compare image data from the input and return frame buffers, and transfer comparison data to the image post processor, the image post processor configured to alter individual μLED control data based on the comparison data.</description><subject>ELECTRIC HEATING</subject><subject>ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB3c_T0CQ1yVXBxDXF1DvH091Nw9HNRcPYPCoJy3fyDFHxcXRQcg4IcI4N5GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgZGxgYG5uamho6ExcaoAjXsmwA</recordid><startdate>20230105</startdate><enddate>20230105</enddate><creator>Bonne, Ronald Johannes</creator><creator>Vajapey, Sridhar</creator><scope>EVB</scope></search><sort><creationdate>20230105</creationdate><title>FAILURE DETECTION AND CORRECTION FOR LED ARRAYS</title><author>Bonne, Ronald Johannes ; 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subjects ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
title FAILURE DETECTION AND CORRECTION FOR LED ARRAYS
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