METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA
Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching wi...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KLUSCÁEK, Jan MACHEK, Ondrej KAPLENKO, Mykola KAPLENKO, Oleksii TÛMA, Tomás |
| description | Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2023003675A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2023003675A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2023003675A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQANAuDqL-w4GzEBvU-UgubaCXhOQcnEqROIkW6v_j4gc4veWtm45J-mgBg4VyK0IMLmawJJTZBx86KMhpIDCRUyxefAzgcmQoiYxkHMCi4LZZPabnUnc_N83ekZj-UOf3WJd5utdX_YzX0qpWK6XPlxMe9X_rC5bsLZI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA</title><source>esp@cenet</source><creator>KLUSCÁEK, Jan ; MACHEK, Ondrej ; KAPLENKO, Mykola ; KAPLENKO, Oleksii ; TÛMA, Tomás</creator><creatorcontrib>KLUSCÁEK, Jan ; MACHEK, Ondrej ; KAPLENKO, Mykola ; KAPLENKO, Oleksii ; TÛMA, Tomás</creatorcontrib><description>Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230105&DB=EPODOC&CC=US&NR=2023003675A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230105&DB=EPODOC&CC=US&NR=2023003675A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KLUSCÁEK, Jan</creatorcontrib><creatorcontrib>MACHEK, Ondrej</creatorcontrib><creatorcontrib>KAPLENKO, Mykola</creatorcontrib><creatorcontrib>KAPLENKO, Oleksii</creatorcontrib><creatorcontrib>TÛMA, Tomás</creatorcontrib><title>METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA</title><description>Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQANAuDqL-w4GzEBvU-UgubaCXhOQcnEqROIkW6v_j4gc4veWtm45J-mgBg4VyK0IMLmawJJTZBx86KMhpIDCRUyxefAzgcmQoiYxkHMCi4LZZPabnUnc_N83ekZj-UOf3WJd5utdX_YzX0qpWK6XPlxMe9X_rC5bsLZI</recordid><startdate>20230105</startdate><enddate>20230105</enddate><creator>KLUSCÁEK, Jan</creator><creator>MACHEK, Ondrej</creator><creator>KAPLENKO, Mykola</creator><creator>KAPLENKO, Oleksii</creator><creator>TÛMA, Tomás</creator><scope>EVB</scope></search><sort><creationdate>20230105</creationdate><title>METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA</title><author>KLUSCÁEK, Jan ; MACHEK, Ondrej ; KAPLENKO, Mykola ; KAPLENKO, Oleksii ; TÛMA, Tomás</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2023003675A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KLUSCÁEK, Jan</creatorcontrib><creatorcontrib>MACHEK, Ondrej</creatorcontrib><creatorcontrib>KAPLENKO, Mykola</creatorcontrib><creatorcontrib>KAPLENKO, Oleksii</creatorcontrib><creatorcontrib>TÛMA, Tomás</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KLUSCÁEK, Jan</au><au>MACHEK, Ondrej</au><au>KAPLENKO, Mykola</au><au>KAPLENKO, Oleksii</au><au>TÛMA, Tomás</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA</title><date>2023-01-05</date><risdate>2023</risdate><abstract>Method and system are disclosed for determining sample composition from spectral data acquired by a charged particle microscopy system. Chemical elements in a sample are identified by processing the spectral data with a trained neural network (NN). If the identified chemical elements not matching with a known elemental composition of the sample, the trained NN is retrained with the spectral data and the known elemental composition of the sample. The retrained NN can then be used to identify chemical elements within other samples.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US2023003675A1 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | METHOD AND SYSTEM FOR DETERMINING SAMPLE COMPOSITION FROM SPECTRAL DATA |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T20%3A57%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KLUSC%C3%81EK,%20Jan&rft.date=2023-01-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2023003675A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |