MACHINE FAULT MODELLING

Systems, methods, non-transitory computer readable media can be configured to access a plurality of sensor logs corresponding to a first machine, each sensor log spanning at least a first period; access first computer readable logs corresponding to the first machine, each computer readable log spann...

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Bibliographische Detailangaben
Hauptverfasser:	Diciolla, Marco, Yip, Jennifer, Menck, Andre Frederico Cavalheiro, Peller, Joanna, Tank, Spencer, Powell, Thomas, Henry, Caroline, Todd, Matthew, Prasad, Anshuman, Thouzeau, Arthur, Spiro, Ezra, Shepherd, Charles, Maag, Peter
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING ELECTRIC DIGITAL DATA PROCESSING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TARIFF METERING APPARATUS TESTING
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