MACHINE FAULT MODELLING

Systems, methods, non-transitory computer readable media can be configured to access a plurality of sensor logs corresponding to a first machine, each sensor log spanning at least a first period; access first computer readable logs corresponding to the first machine, each computer readable log spann...

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Hauptverfasser: Diciolla, Marco, Yip, Jennifer, Menck, Andre Frederico Cavalheiro, Peller, Joanna, Tank, Spencer, Powell, Thomas, Henry, Caroline, Todd, Matthew, Prasad, Anshuman, Thouzeau, Arthur, Spiro, Ezra, Shepherd, Charles, Maag, Peter
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creator Diciolla, Marco
Yip, Jennifer
Menck, Andre Frederico Cavalheiro
Peller, Joanna
Tank, Spencer
Powell, Thomas
Henry, Caroline
Todd, Matthew
Prasad, Anshuman
Thouzeau, Arthur
Spiro, Ezra
Shepherd, Charles
Maag, Peter
description Systems, methods, non-transitory computer readable media can be configured to access a plurality of sensor logs corresponding to a first machine, each sensor log spanning at least a first period; access first computer readable logs corresponding to the first machine, each computer readable log spanning at least the first period, the computer readable logs comprising a maintenance log comprising a plurality of maintenance task objects, each maintenance task object comprising a time and a maintenance task type; determine a set of statistical metrics derived from the sensor logs; determine a set of log metrics derived from the computer readable logs; and determine, using a risk model that receives the statistical metrics and log metrics as inputs, fault probabilities or risk scores indicative of one or more fault types occurring in the first machine within a second period.
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
TARIFF METERING APPARATUS
TESTING
title MACHINE FAULT MODELLING
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