SPECTROPHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM

When a measurement sample whose absorbance greatly changes depending on a wavelength range is measured, measurement with a high S/N ratio and accuracy can be efficiently performed in a short time.For a plurality of wavelength ranges in wavelength scanning measurement of a measurement sample, based o...

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Bibliographische Detailangaben

Hauptverfasser:	MARUYAMA, Kai, Wakui, Takayuki
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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