SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM

Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SAITO, SHINYA, TAKAHASHI, MASAKI, KAWASAKI, EISHI, TSUJI, YOSUKE, HAYASHI, TATSURO, TAKAYAMA, KAZUAKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator SAITO, SHINYA
TAKAHASHI, MASAKI
KAWASAKI, EISHI
TSUJI, YOSUKE
HAYASHI, TATSURO
TAKAYAMA, KAZUAKI
description Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection. A system for non-destructively inspecting baggage, the system comprising a transport means by which baggage is transported, an emission means that irradiates the baggage with X-rays, an imaging means that captures X-rays that have passed through the baggage, an analysis means by which image information from the imaging means is analyzed, and a display means by which an image analyzed by the analysis means is displayed, wherein the system also comprises a control means that performs a control so that, with respect to an article to be sensed in which a subject inside baggage overlaps another subject and in which the subject is to be viewed by X-ray inspection, at least part of the article to be sensed is displayed as an object by the display means when at least part of the article to be sensed has been analyzed.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022381706A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022381706A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022381706A13</originalsourceid><addsrcrecordid>eNrjZKgLjgwOcfVVcPMPUvDz99N1cQ0OCQp1DvEMc_WJVPD0Cw5wBXL83BWcHN3dHd1ddRR8XUM8_F1gGgirDwjydw9y9NVRcPRzUQhydfYPcgHJ-7q6eIb68jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjI2MLQ3MDM0dDY-JUAQAmdTzN</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM</title><source>esp@cenet</source><creator>SAITO, SHINYA ; TAKAHASHI, MASAKI ; KAWASAKI, EISHI ; TSUJI, YOSUKE ; HAYASHI, TATSURO ; TAKAYAMA, KAZUAKI</creator><creatorcontrib>SAITO, SHINYA ; TAKAHASHI, MASAKI ; KAWASAKI, EISHI ; TSUJI, YOSUKE ; HAYASHI, TATSURO ; TAKAYAMA, KAZUAKI</creatorcontrib><description>Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection. A system for non-destructively inspecting baggage, the system comprising a transport means by which baggage is transported, an emission means that irradiates the baggage with X-rays, an imaging means that captures X-rays that have passed through the baggage, an analysis means by which image information from the imaging means is analyzed, and a display means by which an image analyzed by the analysis means is displayed, wherein the system also comprises a control means that performs a control so that, with respect to an article to be sensed in which a subject inside baggage overlaps another subject and in which the subject is to be viewed by X-ray inspection, at least part of the article to be sensed is displayed as an object by the display means when at least part of the article to be sensed has been analyzed.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221201&amp;DB=EPODOC&amp;CC=US&amp;NR=2022381706A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25568,76551</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221201&amp;DB=EPODOC&amp;CC=US&amp;NR=2022381706A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAITO, SHINYA</creatorcontrib><creatorcontrib>TAKAHASHI, MASAKI</creatorcontrib><creatorcontrib>KAWASAKI, EISHI</creatorcontrib><creatorcontrib>TSUJI, YOSUKE</creatorcontrib><creatorcontrib>HAYASHI, TATSURO</creatorcontrib><creatorcontrib>TAKAYAMA, KAZUAKI</creatorcontrib><title>SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM</title><description>Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection. A system for non-destructively inspecting baggage, the system comprising a transport means by which baggage is transported, an emission means that irradiates the baggage with X-rays, an imaging means that captures X-rays that have passed through the baggage, an analysis means by which image information from the imaging means is analyzed, and a display means by which an image analyzed by the analysis means is displayed, wherein the system also comprises a control means that performs a control so that, with respect to an article to be sensed in which a subject inside baggage overlaps another subject and in which the subject is to be viewed by X-ray inspection, at least part of the article to be sensed is displayed as an object by the display means when at least part of the article to be sensed has been analyzed.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZKgLjgwOcfVVcPMPUvDz99N1cQ0OCQp1DvEMc_WJVPD0Cw5wBXL83BWcHN3dHd1ddRR8XUM8_F1gGgirDwjydw9y9NVRcPRzUQhydfYPcgHJ-7q6eIb68jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjI2MLQ3MDM0dDY-JUAQAmdTzN</recordid><startdate>20221201</startdate><enddate>20221201</enddate><creator>SAITO, SHINYA</creator><creator>TAKAHASHI, MASAKI</creator><creator>KAWASAKI, EISHI</creator><creator>TSUJI, YOSUKE</creator><creator>HAYASHI, TATSURO</creator><creator>TAKAYAMA, KAZUAKI</creator><scope>EVB</scope></search><sort><creationdate>20221201</creationdate><title>SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM</title><author>SAITO, SHINYA ; TAKAHASHI, MASAKI ; KAWASAKI, EISHI ; TSUJI, YOSUKE ; HAYASHI, TATSURO ; TAKAYAMA, KAZUAKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022381706A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SAITO, SHINYA</creatorcontrib><creatorcontrib>TAKAHASHI, MASAKI</creatorcontrib><creatorcontrib>KAWASAKI, EISHI</creatorcontrib><creatorcontrib>TSUJI, YOSUKE</creatorcontrib><creatorcontrib>HAYASHI, TATSURO</creatorcontrib><creatorcontrib>TAKAYAMA, KAZUAKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAITO, SHINYA</au><au>TAKAHASHI, MASAKI</au><au>KAWASAKI, EISHI</au><au>TSUJI, YOSUKE</au><au>HAYASHI, TATSURO</au><au>TAKAYAMA, KAZUAKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM</title><date>2022-12-01</date><risdate>2022</risdate><abstract>Provided are a system for non-destructively inspecting baggage, a method for non-destructively inspecting baggage, a program, and a recording medium in which an inspection that corresponds to the owner of an article to be inspected is performed even when the article to be inspected overlaps various objects including similar materials, whereby the system, method, program, and recording medium are efficient and do not exhibit any oversight in inspection. A system for non-destructively inspecting baggage, the system comprising a transport means by which baggage is transported, an emission means that irradiates the baggage with X-rays, an imaging means that captures X-rays that have passed through the baggage, an analysis means by which image information from the imaging means is analyzed, and a display means by which an image analyzed by the analysis means is displayed, wherein the system also comprises a control means that performs a control so that, with respect to an article to be sensed in which a subject inside baggage overlaps another subject and in which the subject is to be viewed by X-ray inspection, at least part of the article to be sensed is displayed as an object by the display means when at least part of the article to be sensed has been analyzed.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2022381706A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SYSTEM FOR NON-DESTRUCTIVELY INSPECTING BAGGAGE, METHOD FOR NONDESTRUCTIVELY INSPECTING BAGGAGE, PROGRAM, AND RECORDING MEDIUM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-16T23%3A53%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAITO,%20SHINYA&rft.date=2022-12-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2022381706A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true