DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION

Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the asso...

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Hauptverfasser: Cao, Xiwu, Denney, Bradley Scott
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creator Cao, Xiwu
Denney, Bradley Scott
description Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022366181A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022366181A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022366181A13</originalsourceid><addsrcrecordid>eNrjZDB2cQ3zdHYN1lEIjgwOcfUFMhz9XBR8XUM8_F2CFdz8g4B8f19Hn0gFF9cQV-cQT38_HgbWtMSc4lReKM3NoOzmGuLsoZtakB-fWlyQmJyal1oSHxpsZGBkZGxmZmhh6GhoTJwqACXrJ90</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION</title><source>esp@cenet</source><creator>Cao, Xiwu ; Denney, Bradley Scott</creator><creatorcontrib>Cao, Xiwu ; Denney, Bradley Scott</creatorcontrib><description>Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221117&amp;DB=EPODOC&amp;CC=US&amp;NR=2022366181A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20221117&amp;DB=EPODOC&amp;CC=US&amp;NR=2022366181A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Cao, Xiwu</creatorcontrib><creatorcontrib>Denney, Bradley Scott</creatorcontrib><title>DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION</title><description>Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB2cQ3zdHYN1lEIjgwOcfUFMhz9XBR8XUM8_F2CFdz8g4B8f19Hn0gFF9cQV-cQT38_HgbWtMSc4lReKM3NoOzmGuLsoZtakB-fWlyQmJyal1oSHxpsZGBkZGxmZmhh6GhoTJwqACXrJ90</recordid><startdate>20221117</startdate><enddate>20221117</enddate><creator>Cao, Xiwu</creator><creator>Denney, Bradley Scott</creator><scope>EVB</scope></search><sort><creationdate>20221117</creationdate><title>DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION</title><author>Cao, Xiwu ; Denney, Bradley Scott</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022366181A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Cao, Xiwu</creatorcontrib><creatorcontrib>Denney, Bradley Scott</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cao, Xiwu</au><au>Denney, Bradley Scott</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION</title><date>2022-11-17</date><risdate>2022</risdate><abstract>Devices, systems, and methods obtain one or more training images; obtain a test image; select one or more associated pixels in the training images for a target pixel in the training images; calculate respective value relationships between a value of the target pixel and respective values of the associated pixels in the training images; select one or more associated pixels in the test image for a target pixel in the test image; and detect an anomaly in the target pixel in the test image based on the respective value relationships between the value of the target pixel and the respective values of the associated pixels in the training images and on respective value relationships between a value of the target pixel and respective values of the associated pixels in the test image.</abstract><oa>free_for_read</oa></addata></record>
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subjects CALCULATING
COMPUTING
COUNTING
PHYSICS
title DEVICES, SYSTEMS, AND METHODS FOR ANOMALY DETECTION
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T03%3A52%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Cao,%20Xiwu&rft.date=2022-11-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2022366181A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true