Recipe Information Presentation System and Recipe Error Inference System

An objective of the present invention is to provide a system which can infer the cause of a recipe error and present a correction candidate for the recipe error. A recipe information presentation system or recipe error inference system according to the present invention: causes a learner to learn a...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	UEDA, Kazuhiro, YOSHIDA, Yasuhiro, HAYAKAWA, Kouichi, TAKANO, Masami, ISHIKAWA, Masayoshi
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	UEDA, Kazuhiro YOSHIDA, Yasuhiro HAYAKAWA, Kouichi TAKANO, Masami ISHIKAWA, Masayoshi
description	An objective of the present invention is to provide a system which can infer the cause of a recipe error and present a correction candidate for the recipe error. A recipe information presentation system or recipe error inference system according to the present invention: causes a learner to learn a correspondence between a recipe and an error originating from the recipe; and acquires from the learner an inference result as to whether the error occurs when a new recipe is used (refer to FIG. 1).
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022334172A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022334172A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022334172A13</originalsourceid><addsrcrecordid>eNrjZPAISk3OLEhV8MxLyy_KTSzJzM9TCChKLU7NK4FwgiuLS1JzFRLzUhSgSl2LivKLQBpSi1LzklOhKngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBkZGxsYmhuZGjoTFxqgBwuTUf</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Recipe Information Presentation System and Recipe Error Inference System</title><source>esp@cenet</source><creator>UEDA, Kazuhiro ; YOSHIDA, Yasuhiro ; HAYAKAWA, Kouichi ; TAKANO, Masami ; ISHIKAWA, Masayoshi</creator><creatorcontrib>UEDA, Kazuhiro ; YOSHIDA, Yasuhiro ; HAYAKAWA, Kouichi ; TAKANO, Masami ; ISHIKAWA, Masayoshi</creatorcontrib><description>An objective of the present invention is to provide a system which can infer the cause of a recipe error and present a correction candidate for the recipe error. A recipe information presentation system or recipe error inference system according to the present invention: causes a learner to learn a correspondence between a recipe and an error originating from the recipe; and acquires from the learner an inference result as to whether the error occurs when a new recipe is used (refer to FIG. 1).</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221020&DB=EPODOC&CC=US&NR=2022334172A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221020&DB=EPODOC&CC=US&NR=2022334172A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UEDA, Kazuhiro</creatorcontrib><creatorcontrib>YOSHIDA, Yasuhiro</creatorcontrib><creatorcontrib>HAYAKAWA, Kouichi</creatorcontrib><creatorcontrib>TAKANO, Masami</creatorcontrib><creatorcontrib>ISHIKAWA, Masayoshi</creatorcontrib><title>Recipe Information Presentation System and Recipe Error Inference System</title><description>An objective of the present invention is to provide a system which can infer the cause of a recipe error and present a correction candidate for the recipe error. A recipe information presentation system or recipe error inference system according to the present invention: causes a learner to learn a correspondence between a recipe and an error originating from the recipe; and acquires from the learner an inference result as to whether the error occurs when a new recipe is used (refer to FIG. 1).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAISk3OLEhV8MxLyy_KTSzJzM9TCChKLU7NK4FwgiuLS1JzFRLzUhSgSl2LivKLQBpSi1LzklOhKngYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBkZGxsYmhuZGjoTFxqgBwuTUf</recordid><startdate>20221020</startdate><enddate>20221020</enddate><creator>UEDA, Kazuhiro</creator><creator>YOSHIDA, Yasuhiro</creator><creator>HAYAKAWA, Kouichi</creator><creator>TAKANO, Masami</creator><creator>ISHIKAWA, Masayoshi</creator><scope>EVB</scope></search><sort><creationdate>20221020</creationdate><title>Recipe Information Presentation System and Recipe Error Inference System</title><author>UEDA, Kazuhiro ; YOSHIDA, Yasuhiro ; HAYAKAWA, Kouichi ; TAKANO, Masami ; ISHIKAWA, Masayoshi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022334172A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>UEDA, Kazuhiro</creatorcontrib><creatorcontrib>YOSHIDA, Yasuhiro</creatorcontrib><creatorcontrib>HAYAKAWA, Kouichi</creatorcontrib><creatorcontrib>TAKANO, Masami</creatorcontrib><creatorcontrib>ISHIKAWA, Masayoshi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>UEDA, Kazuhiro</au><au>YOSHIDA, Yasuhiro</au><au>HAYAKAWA, Kouichi</au><au>TAKANO, Masami</au><au>ISHIKAWA, Masayoshi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Recipe Information Presentation System and Recipe Error Inference System</title><date>2022-10-20</date><risdate>2022</risdate><abstract>An objective of the present invention is to provide a system which can infer the cause of a recipe error and present a correction candidate for the recipe error. A recipe information presentation system or recipe error inference system according to the present invention: causes a learner to learn a correspondence between a recipe and an error originating from the recipe; and acquires from the learner an inference result as to whether the error occurs when a new recipe is used (refer to FIG. 1).</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	eng
recordid	cdi_epo_espacenet_US2022334172A1
source	esp@cenet
subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	Recipe Information Presentation System and Recipe Error Inference System
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-11T06%3A11%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=UEDA,%20Kazuhiro&rft.date=2022-10-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2022334172A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true