DEFECT RESOLUTION
Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria infor...
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| creator | McFarland, Christopher Kraytem, Hind Lay, Ludovic Drizard, Arnaud Caillé, Jean |
| description | Systems, methods, and non-transitory computer readable media are provided for facilitating improved defect resolution. Defect information and defect criteria information may be obtained. The defect information may identify defects of software and/or hardware in development. The defect criteria information may define one or more criteria for measuring the defects. The defects may be measured based on the one or more criteria. A defect analysis interface may be provided. The defect analysis interface may list a limited number of the defects based on the measurements of the defects. The defect analysis interface may provide costs (e.g., computing resources, time, personnel) of solving the defects. |
| format | Patent |
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| language | eng |
| recordid | cdi_epo_espacenet_US2022292010A1 |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | DEFECT RESOLUTION |
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