METHOD FOR CONTROLLING SPECIMEN ANALYSIS SYSTEM AND SPECIMEN ANALYSIS SYSTEM

A method for controlling a specimen analysis system including at least one measurement unit according to one or more embodiments is disclosed. The method may include automatically starting at least one measurement unit according to a schedule registered by a user; automatically supplying a quality c...

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Bibliographische Detailangaben
Hauptverfasser:	OHMAE, Yuichiro, UEMURA, Toru, WAKAMIYA, Yuji, HAYAMA, Hidetaka
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method for controlling a specimen analysis system including at least one measurement unit according to one or more embodiments is disclosed. The method may include automatically starting at least one measurement unit according to a schedule registered by a user; automatically supplying a quality control specimen to the measurement unit that is automatically started; and measuring the quality control specimen by the measurement unit.