PLASMA PROCESSING METHOD

An object of the present invention is to provide a plasma processing method capable of removing complex depositions of metal and non-metal deposited in a processing chamber by etching processing of a wafer to reduce generation of particle due to the depositions, in a plasma processing method for pla...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Hirota, Kosa, Sumiya, Masahiro, Tamari, Nanako, Nakamoto, Shigeru, Inoue, Satomi, Nakaune, Koichi
Format: Patent
Sprache:eng
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