MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL

MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL

A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multipl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KATSUMATA, Tomohiro, KOSHOUBU, Jun, NAKAGAWA, Kazuya
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KATSUMATA, Tomohiro
KOSHOUBU, Jun
NAKAGAWA, Kazuya
description A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle φ of incidence crosses the x-y plane at a specific angle [[φz]].
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022260816A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022260816A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022260816A13</originalsourceid><addsrcrecordid>eNrjZLDyDfUJ8QzwcdUNcnXzcXUO8fT3U3AMCHAMcgwJDVZw9HNRwKbC2dXHh4eBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYXJCan5qWWxIcGGxkYGRmZGVgYmjkaGhOnCgCB8Co7</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL</title><source>esp@cenet</source><creator>KATSUMATA, Tomohiro ; KOSHOUBU, Jun ; NAKAGAWA, Kazuya</creator><creatorcontrib>KATSUMATA, Tomohiro ; KOSHOUBU, Jun ; NAKAGAWA, Kazuya</creatorcontrib><description>A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle φ of incidence crosses the x-y plane at a specific angle [[φz]].</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220818&amp;DB=EPODOC&amp;CC=US&amp;NR=2022260816A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220818&amp;DB=EPODOC&amp;CC=US&amp;NR=2022260816A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KATSUMATA, Tomohiro</creatorcontrib><creatorcontrib>KOSHOUBU, Jun</creatorcontrib><creatorcontrib>NAKAGAWA, Kazuya</creatorcontrib><title>MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL</title><description>A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle φ of incidence crosses the x-y plane at a specific angle [[φz]].</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDyDfUJ8QzwcdUNcnXzcXUO8fT3U3AMCHAMcgwJDVZw9HNRwKbC2dXHh4eBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYXJCan5qWWxIcGGxkYGRmZGVgYmjkaGhOnCgCB8Co7</recordid><startdate>20220818</startdate><enddate>20220818</enddate><creator>KATSUMATA, Tomohiro</creator><creator>KOSHOUBU, Jun</creator><creator>NAKAGAWA, Kazuya</creator><scope>EVB</scope></search><sort><creationdate>20220818</creationdate><title>MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL</title><author>KATSUMATA, Tomohiro ; KOSHOUBU, Jun ; NAKAGAWA, Kazuya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022260816A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KATSUMATA, Tomohiro</creatorcontrib><creatorcontrib>KOSHOUBU, Jun</creatorcontrib><creatorcontrib>NAKAGAWA, Kazuya</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KATSUMATA, Tomohiro</au><au>KOSHOUBU, Jun</au><au>NAKAGAWA, Kazuya</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL</title><date>2022-08-18</date><risdate>2022</risdate><abstract>A multiple-reflection apparatus and a multiple-reflection cell includes: a pair of parallel plane mirrors that multiply reflects a laser light, in zigzag, which enters at a specific angle of incidence; a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled to one end between the parallel plane mirrors; and a right-angle double mirror having two perpendicular reflection surfaces for returning the multiple-reflection light that traveled from the right-angle double mirror on one end side to the other end between the parallel plane mirrors. When the two parallel mirror surfaces configuring the parallel plane mirrors are disposed to be parallel to the z-x plane of the x-y-z axial coordinate system, the two reflection surfaces configuring the right-angle double mirror are perpendicular to the x-y plane, and the laser light entering at the angle φ of incidence crosses the x-y plane at a specific angle [[φz]].</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2022260816A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title MULTIPLE-REFLECTION APPARATUS AND MULTIPLE-REFLECTION CELL
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T17%3A55%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KATSUMATA,%20Tomohiro&rft.date=2022-08-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2022260816A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true