X-RAY FLUORESCENCE SPECTROMETER

A sequential X-ray fluorescence spectrometer according to the present invention includes a total analysis time display unit configured to measure, for each kind of analytical sample, a standard sample which contains a component at a known content as a standard value to determine a measured intensity...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGOSHI, Yasuhiko, KATAOKA, Yoshiyuki
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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