MEASUREMENT OF PROPERTIES OF PATTERNED PHOTORESIST

MEASUREMENT OF PROPERTIES OF PATTERNED PHOTORESIST

A method for optical inspection includes illuminating a patterned polymer layer on a semiconductor wafer with optical radiation over a range of infrared wavelengths, measuring spectral properties of the optical radiation reflected from multiple points on the patterned polymer layer over the range of...

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Hauptverfasser: Manassen, Amnon, Uziel, Yoram, Yerushalmi, Liran, Volkovich, Roie
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Manassen, Amnon
Uziel, Yoram
Yerushalmi, Liran
Volkovich, Roie
description A method for optical inspection includes illuminating a patterned polymer layer on a semiconductor wafer with optical radiation over a range of infrared wavelengths, measuring spectral properties of the optical radiation reflected from multiple points on the patterned polymer layer over the range of infrared wavelengths, and based on the measured spectral properties, computing a complex refractive index of the patterned polymer layer.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title MEASUREMENT OF PROPERTIES OF PATTERNED PHOTORESIST
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