Sample Processing Improvements For Microscopy

Among other things, a first surface is configured to receive a sample and is to be used in a microscopy device. There is a second surface to be moved into a predefined position relative to the first surface to form a sample space that is between the first surface and the second surface and contains...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Macaulay, Hershel, Hymes-Vandermeulen, Noah, Fine, Alan Marc
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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