TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME

TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME

A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperatu...

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Hauptverfasser: Loya, Nathan S, Cavanaugh, Jack M
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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creator Loya, Nathan S
Cavanaugh, Jack M
description A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. The insert, which is formed of silicon carbide, is operably interposed between the sidewall and the temperature-sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing a temperature probe is also provided.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2022205847A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2022205847A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2022205847A13</originalsourceid><addsrcrecordid>eNrjZNANcfUNcA1yDAkNclUICPJ3clUI9wzxUPD0BXLCXF0UglyDA_z9gl0VQjx9XXkYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBkZGRgamFibmjoTFxqgB2liau</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME</title><source>esp@cenet</source><creator>Loya, Nathan S ; Cavanaugh, Jack M</creator><creatorcontrib>Loya, Nathan S ; Cavanaugh, Jack M</creatorcontrib><description>A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. The insert, which is formed of silicon carbide, is operably interposed between the sidewall and the temperature-sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing a temperature probe is also provided.</description><language>eng</language><subject>MEASURING ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220630&amp;DB=EPODOC&amp;CC=US&amp;NR=2022205847A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220630&amp;DB=EPODOC&amp;CC=US&amp;NR=2022205847A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Loya, Nathan S</creatorcontrib><creatorcontrib>Cavanaugh, Jack M</creatorcontrib><title>TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME</title><description>A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. The insert, which is formed of silicon carbide, is operably interposed between the sidewall and the temperature-sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing a temperature probe is also provided.</description><subject>MEASURING</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANcfUNcA1yDAkNclUICPJ3clUI9wzxUPD0BXLCXF0UglyDA_z9gl0VQjx9XXkYWNMSc4pTeaE0N4Oym2uIs4duakF-fGpxQWJyal5qSXxosJGBkZGRgamFibmjoTFxqgB2liau</recordid><startdate>20220630</startdate><enddate>20220630</enddate><creator>Loya, Nathan S</creator><creator>Cavanaugh, Jack M</creator><scope>EVB</scope></search><sort><creationdate>20220630</creationdate><title>TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME</title><author>Loya, Nathan S ; Cavanaugh, Jack M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2022205847A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2022</creationdate><topic>MEASURING</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>Loya, Nathan S</creatorcontrib><creatorcontrib>Cavanaugh, Jack M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Loya, Nathan S</au><au>Cavanaugh, Jack M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME</title><date>2022-06-30</date><risdate>2022</risdate><abstract>A temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space therein. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. The insert, which is formed of silicon carbide, is operably interposed between the sidewall and the temperature-sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing a temperature probe is also provided.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
title TEMPERATURE PROBE WITH IMPROVED RESPONSE TIME
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T19%3A52%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Loya,%20Nathan%20S&rft.date=2022-06-30&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2022205847A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true