NANOPARTICLE RECOGNITION DEVICE AND METHOD BASED ON DETECTION OF SCATTERED LIGHT WITH ELECTRIC DIPOLE ROTATION

NANOPARTICLE RECOGNITION DEVICE AND METHOD BASED ON DETECTION OF SCATTERED LIGHT WITH ELECTRIC DIPOLE ROTATION

The present application discloses a nanoparticle recognition device and method based on detection of scattered light with electric dipole rotation. According to the scattering model of nanoparticles, the in situ detection of particle morphology in an optical trap is realized by the methods of partic...

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Hauptverfasser: CHEN, Zhiming, ZHU, Shaochong, HE, Zhaoxiong, HU, Huizhu, LI, Cuihong, MA, Yuanyuan
Format: Patent
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator CHEN, Zhiming
ZHU, Shaochong
HE, Zhaoxiong
HU, Huizhu
LI, Cuihong
MA, Yuanyuan
description The present application discloses a nanoparticle recognition device and method based on detection of scattered light with electric dipole rotation. According to the scattering model of nanoparticles, the in situ detection of particle morphology in an optical trap is realized by the methods of particle suspension control and scattered light detection and separation. Specifically, two linearly polarized laser beams are used, wherein the first laser beam suspends nanoparticles and rotates nanoparticles by adjusting the polarization direction; the polarization direction of the second linearly polarized light is unchanged, and scattered light in a specific dipole direction is excited; the change of the polarizability of the nanoparticles is deduced by monitoring the change of the light intensity of the scattered light excited by the second laser beam at the fixed position, so that particle morphology recognition is realized.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title NANOPARTICLE RECOGNITION DEVICE AND METHOD BASED ON DETECTION OF SCATTERED LIGHT WITH ELECTRIC DIPOLE ROTATION
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