Computer System of Observation Device and Processing Method

As a technology for an observation device and an inspection device, a technology capable of reducing a work effort related to generation of a recipe including alignment information is provided. An observation device 1 includes an observation unit 103 that obtains an image for observing a sample 101...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MATSUMOTO, Kosuke, Nakayama, Hideki, Miyake, Kozo, Fukuda, Miyuki, Isomae, Yuya, Takada, Satoshi
Format: Patent
Sprache:eng
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